Method and device for nondestructively screening radiation tolerances of resistors

Abstract

The invention provides a method and device for nondestructively screening radiation tolerances of resistors; the method comprises: acquiring pre-radiation resistance value and 1 / f noise voltage power spectrum amplitude of a resistor acting as a random sample; acquiring post-radiation resistance value of the resistor acting as the random sample; calculating pre-radiation and post-radiation resistance drift based on the pre-radiation resistor resistance value and post-radiation resistor resistance value; using the 1 / f noise voltage power spectrum amplitude as an information parameter and the resistance drift as a radiation performance parameter to establish a multiple linear regression equation, and calculating a coefficient vector in the multiple linear regression equation; establishing a nondestructive screening regression prediction equation between the information parameter and the radiation performance parameter based on the coefficient vector; using the nondestructive screening regression prediction equation to screen other resistors in a same lot. The method and device can provide accurate and efficient radiation tolerance testing and screening for components at the premise of not destructing the resistors.

Description

technical field [0001] The invention relates to the technical field of electronic appliances, in particular to a method and device for non-destructive screening of resistance to radiation of resistors. Background technique [0002] Resistors used in the space environment are often subject to various radiation disturbances in the space environment, including space radiation, electromagnetic radiation and alpha particle radiation, and because space equipment is in a state of being unrepairable in space, its electronic components are required to have a long life Therefore, the reliability requirements for electronic components used in space equipment are far more stringent than those in other electronic systems. For the above reasons, the radiation resistance of aerospace resistors must be checked before boarding or launching. Effective detection, evaluation and screening. [0003] In the prior art, there are mainly two methods for testing and screening the radiation resistanc...

AI Technical Summary

Problems solved by technology

This method has the defects of high detection cost, long detection time and certain destructiveness; and because of the method of using large dose rate test to equivalent space low dose rate irradiation environment, the simulation results are often inaccurate

The technical difficulty of the multiple regression analysis method in the prior art is how to select sensitive information parameters, which can not only realize the prediction of the anti-irradiation ability before irradiation, but also be closely related to the microscopic damage of the device. The resistance value drift is used as an information parameter, and the resistance value drift after irradiation is used as an irradiation performance parameter. This method ignores the fact that the change of the noise amplitude B directly reflects the defect state in the device, resulting in an inaccurate regression prediction equation. Ultimately affects the accuracy and reliability of resistor screening

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