A Modeling Method for Parameter Stability of Quartz Flexible Accelerometer

A technology of accelerometer and modeling method, applied in calculation, electrical digital data processing, computer-aided design, etc., can solve the problems of poor repeatability of quartz flexible accelerometer parameters, poor accelerometer stability, etc.

Active Publication Date: 2019-11-29
BEIHANG UNIV
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Problems solved by technology

[0007] The object of the present invention is to provide a kind of quartz flexible accelerometer parameter stability modeling method, it solves the problem that the parameter repeatability of quartz flexible accelerometer is poor (accelerometer stability is poor), designed accelerated stability test, based on A multi-stage degradation model with random change points, establishing the stability model of accelerometer parameters and estimation of random change points, to determine the number of cycles that make the accelerometer parameters enter a stable profile

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  • A Modeling Method for Parameter Stability of Quartz Flexible Accelerometer

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[0053] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0054] The following embodiments are based on the quartz flexible accelerometer as the research object figure 1 The flow shown is carried out in an accelerated stability test applying two types of stress: rapid temperature change cycle and random vibration. The combined stress is subdivided into the following seven test factors: high temperature, low temperature, rate of temperature heating / cooling change, high temperature hold time, low temperature hold time, vibration amplitude, and vibration time. See Table 1 for the determination of the specific values ​​of temperature and vibration amplitude. For a specific test profile, see image 3 , figure 2 is the power spectral density of the vibration amplitude. Eight accelerometer samples were used in this test. Depend on Figure 4 , Figure 5 The analysis of test data shows that the degradation pr...

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Abstract

The invention discloses a quartz flexure accelerometer parameter stability modeling method, namely a parameter stability modeling method for a quartz flexure accelerometer based on a random point degradation model. The method comprises the steps that first, the degradation model containing random change points is established; second, a likelihood function of observation data is estimated; third, a deficient number is separated from the observation data; and fourth, parameter estimation is performed through an EM algorithm. Through the steps, the degradation model is established through product main performance parameters, test cost and test time are saved for products with high construction cost, high reliability and long service life, and the method has practical significance; an accelerometer parameter stability model is established and the random change points are estimated mainly targeting the problem of poor parameter repeatability of the quartz flexure accelerometer to make sure accelerometer parameters gets into a stable profile cycle number, and the method has huge practical significance in practical engineering application.

Description

technical field [0001] The invention provides a parameter stability modeling method of a quartz flexible accelerometer, which relates to a parameter stability modeling method of a quartz flexible accelerometer based on a random point degradation model, which is based on a degradation model containing random change points, Aiming at the problem of poor repeatability of the parameters of the quartz flexible accelerometer, an accelerated stability test was designed to model the data of the accelerometer parameter stability test. This belongs to accelerated degradation test data processing in the field of reliability technology. Background technique [0002] Quartz flexible accelerometer is an electromechanical product whose main function is to detect the linear motion information of the carrier. It is widely used in missiles, satellites, rockets and other aircraft. After the overall manufacturing and assembly of the product, due to the influence of temperature stress and resi...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCG06F30/17G06F2119/06
Inventor 许丹何娇兰
Owner BEIHANG UNIV
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