A method and device for measuring a trace metal ion concentration
A technology for trace metal and ion concentration, applied in the field of UV-Vis spectroscopy quantitative analysis, can solve the problems of poor additivity, overlapping detection signals, strong nonlinearity, etc., to reduce the number of variables, reduce interference, improve accuracy and real-time sexual effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0037] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are the Some, but not all, embodiments are invented. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0038] figure 1 A schematic flow chart of the method for measuring the concentration of trace metal ions provided by the embodiments of the present invention, such as figure 1 As shown, it includes: S1, according to the absorbance of the solution containing trace metal ions in the whole band, using the predicted root mean square error to obtain the optimal wavelength i...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com