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Photo-thermal common-path interference module and method for measuring crystal defect

A common path, photothermal technology, applied in the direction of optical testing flaws/defects, testing crystals, color/spectral characteristics measurement, etc., can solve the lack of comparability, restricting the research and development of crystal materials, and the lack of uniform standards for crystal material measurement and other problems, to achieve the effect of large measurement range, good versatility and scalability, and high precision

Inactive Publication Date: 2017-09-01
FUJIAN INST OF RES ON THE STRUCTURE OF MATTER CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Researchers generally use the method of non-external field loading to statically test the crystal performance to roughly judge the optical characteristics of the crystal in the actual work of the laser, but the results obtained by these methods are quite different from the crystal performance under the actual working conditions of the laser. , and are all non-quantitative tests, the test results obtained by different observers are not comparable to each other, which makes the research and measurement of dynamic mesoscopic defects of crystal materials lack a unified standard, which greatly restricts the research and development of related crystal materials

Method used

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  • Photo-thermal common-path interference module and method for measuring crystal defect
  • Photo-thermal common-path interference module and method for measuring crystal defect

Examples

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Effect test

Embodiment 1

[0037] With laser crystal Nd:YVO 4 As an example, the three-dimensional distribution of crystal dynamic mesoscopic defects of the crystal is tested.

[0038] The structure of the photothermal common path interference module in this embodiment is as follows: figure 1 As shown, the photothermal common path interference module 1 includes a detection light source 11 , a pump light source 12 , a sample holder 14 , a laser power meter 16 and a wavefront detector 18 , and a sample 15 is placed on the sample holder 14 .

[0039] Specifically, the sample 15 is placed on a three-dimensionally movable sample holder 14, and the minimum moving step of the sample holder 14 is 10 μm.

[0040] The pump light source 12 adopts a 1064nm laser with a power of 30W, irradiates and passes through the sample 15, and then shoots to the laser power meter 16, and the laser power meter 16 records the optical power information. The laser beam emitted by the pump light source irradiates the sample with a...

Embodiment 2

[0044] With laser crystal Nd:YVO 4 As an example, the three-dimensional distribution of crystal dynamic mesoscopic defects of the crystal is tested.

[0045] The structure of the photothermal common path interference module in this embodiment is as follows: figure 2 As shown, the photothermal common path interference module 1 includes a detection light source 11, a pump light source 12, a converging optical path 13, a sample holder 14, a laser power meter 16, a measuring optical path 17, and a wavefront detector 18. The sample 15 is placed on the sample Rack 14 above.

[0046] Specifically, the sample 15 is placed on a three-dimensionally movable sample holder 14, and the minimum moving step of the sample holder 14 is 10 μm.

[0047] The pump light source 12 adopts a 1064nm laser with a power of 10W, irradiates and passes through the sample 15, and then shoots to the laser power meter 16, and the laser power meter 16 records the optical power information. The laser beam em...

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Abstract

The invention discloses a photo-thermal common-path interference module which is applied to a crystal defect measurement instrument. The crystal defect measurement instrument based on a module is characterized in that pump laser and detection laser are focused at the same point of a sample to test a dynamical mesoscopic defect of the sample; a dynamic defect three-dimensional distribution map of the sample is obtained through movement of the sample. The photo-thermal common-path interference module disclosed by the invention comprises a pumping light source, a detection light source, a converging light path, a sample frame, a measurement light path, a laser power meter, and a wave-front detector, wherein a test point is heated through the pump laser; remaining laser is received by the laser power meter; the detection laser passes through the heated test point; interference is changed in front of waves according to the temperature distribution of the test point; weak laser passing through the sample passes through the measurement light path, and is irradiated into the wave-front detector; changed wave-front information is measured, and the heating condition and absorption capacity of an irradiation point are obtained through comparative calculation.

Description

technical field [0001] The invention relates to the field of crystal defect measurement, in particular to a photothermal common path interference module applied to a crystal defect measurement instrument. Background technique [0002] So far, no standard test method for dynamic mesoscopic defects in crystals has been established at home and abroad, and there is no commercial testing instrument on the market. However, the importance of crystal dynamic mesoscopic defects on the impact of strong laser has attracted the attention of researchers at home and abroad, and the problem of crystal bulk absorption under laser irradiation has attracted attention. With the development of high-energy lasers, higher and higher requirements are put forward for crystal materials, and crystal materials inevitably have absorption due to the manufacturing process (growth process) and the existence of raw material impurities. [0003] According to related research, the internal temperature of th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17G01N21/88G01N21/84G01N21/39G01N21/47G01N21/49G01N21/23
CPCG01N21/171G01N21/23G01N21/39G01N21/47G01N21/49G01N21/84G01N21/8806G01N2021/4735G01N2021/8477
Inventor 吴少凡郑熠黄鑫
Owner FUJIAN INST OF RES ON THE STRUCTURE OF MATTER CHINESE ACAD OF SCI
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