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Semiconductor structure, self-supporting gallium nitride layer and preparation methods therefor

A gallium nitride layer and semiconductor technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as poor universality, cracking of gallium nitride epitaxial layers, low yield, etc., to suppress excessive decomposition , the effect of improving growth quality and reducing stress

Active Publication Date: 2017-09-22
镓特半导体科技(上海)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Among them, laser lift-off technology is often used to separate gallium nitride grown on sapphire substrates. However, laser lift-off has high requirements on the flatness of gallium nitride crystals, and it is not easy to lift off larger-sized gallium nitride crystals; self-lift-off technology The stress generated by the thermal mismatch acts on the specific connection between the epitaxial GaN crystal and the heterogeneous substrate to make the epitaxial layer and the template fracture and separate. However, the thermal stress generated in the existing self-stripping process often causes the nitride The gallium epitaxial layer is broken, or the epitaxial layer cannot be peeled off. The self-stripping technology has high requirements for the growth process of the gallium nitride crystal, the design and production of the patterned substrate, and the yield of a complete gallium nitride crystal obtained by self-stripping is low; Mechanical stripping is the use of mechanical grinding to remove foreign substrates. However, mechanical stripping is suitable for low hardness and fragile foreign substrates; chemical etching stripping uses chemical agents that can remove foreign substrates and are not easy to corrode gallium nitride. To remove the foreign substrate on the back, chemical stripping requires the thermal stability of the foreign substrate to be good and easy to corrode
It can be seen from the above that the laser lift-off process, the mechanical lift-off process and the chemical etching lift-off process all need to perform an additional lift-off process after the gallium nitride growth process is completed, which increases the process steps and process complexity, thereby increasing the cost. At the same time, the laser lift-off process, mechanical stripping process, and chemical etching stripping process all have strict requirements on heterogeneous substrates, and their universality is poor; although the existing self-stripping process can realize self-striping of heterogeneous substrates and gallium nitride, the stripping The quality of gallium nitride will be affected during the process, and the yield rate is low

Method used

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  • Semiconductor structure, self-supporting gallium nitride layer and preparation methods therefor
  • Semiconductor structure, self-supporting gallium nitride layer and preparation methods therefor
  • Semiconductor structure, self-supporting gallium nitride layer and preparation methods therefor

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Embodiment 1

[0068] see figure 1 , the invention provides a method for preparing a semiconductor structure, the method for preparing a semiconductor structure includes the following steps:

[0069] 1) Provide the substrate;

[0070] 2) forming a gallium-containing decomposition layer and a decomposition barrier layer on the upper surface of the substrate; wherein, the gallium-containing decomposition layer is located on the upper surface of the substrate, and the decomposition barrier layer is located on the gallium-containing decomposition layer upper surface;

[0071] 3) forming a patterned mask layer on the upper surface of the structure obtained in step 2); several openings are formed in the patterned mask layer, and the openings expose part of the decomposition barrier layer;

[0072] 4) Process the structure obtained in step 3) to decompose and reconstruct the gallium-containing decomposed layer to obtain a decomposed and reconstructed stack, wherein the decomposed and reconstructe...

Embodiment 2

[0114] Please combine Figure 1 to Figure 7 refer to Figure 9 to Figure 15 , the present invention also provides a method for preparing a semiconductor structure. The method for preparing a semiconductor structure described in this embodiment is substantially the same as the method described in Embodiment 1. The difference between the two is that step 2 of Embodiment 1 The gallium-containing decomposing layer 11 formed in ) is located on the upper surface of the substrate 10, the decomposition barrier layer 12 is located on the upper surface of the gallium-containing decomposing layer 11, and the thickness of the gallium-containing decomposing layer 11 can be is but not limited to 100nm-6μm; preferably, the thickness of the gallium-containing decomposition layer 11 is 150nm-1000nm; more preferably, the thickness of the gallium-containing decomposition layer 11 is 200nm-900nm; more preferably, the The thickness of the gallium-containing decomposition layer 11 is 300nm-800nm; ...

Embodiment 3

[0118] Please combine Figure 1 to Figure 7 refer to Figure 16 and Figure 17 , the present invention also provides a method for preparing a semiconductor structure. The method for preparing a semiconductor structure described in this embodiment is substantially the same as the method described in Embodiment 1. The difference between the two is that the semiconductor structure of this embodiment Compared with the preparation method described in Example 1, a method for forming nitrogen on the upper surface of the substrate 10 is added between step 1) and step 2) of the preparation method described in Example 1. The step of forming the aluminum nitride layer 15, the aluminum nitride layer 15 is located between the substrate 10 and the gallium-containing decomposed layer 11; that is, the aluminum nitride layer 15 is first formed on the upper surface of the substrate 10 , and then form the gallium-containing decomposed layer 11 on the upper surface of the aluminum nitride layer...

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Abstract

The invention provides a semiconductor structure, a self-supporting gallium nitride layer and preparation methods therefor. The preparation method for the semiconductor structure comprises the following steps of 1) providing a substrate; 2) forming a gallium-containing decomposition layer and a decomposition barrier layer on the upper surface of the substrate; 3) forming a graphic mask layer on the upper surface of the structure obtained in the step 2); and 4) performing processing on the structure obtained in the step 3) to enable the gallium-containing decomposition layer to be decomposed and reconfigured to obtain a decomposed and reconfigured lamination layer. By adoption of the preparation method for the semiconductor structure, when the semiconductor structure is used for growth of gallium nitride, a gallium nitride crystal seed layer in the decomposed and reconfigured lamination layer can provide crystal seeds for subsequent growth of gallium nitride, while holes in the decomposed and reconfigured layer can facilitate self-stripping of gallium nitride in subsequent growth, reduce stress between crystal lattices of gallium nitride in subsequent growth, as well as can improve growth quality of gallium nitride.

Description

technical field [0001] The invention belongs to the technical field of semiconductors, and in particular relates to a semiconductor structure, a self-supporting gallium nitride layer and a preparation method thereof. Background technique [0002] The third-generation semiconductor materials are also called wide-bandgap semiconductors because their energy bandgap is generally greater than 3.0 electron volts. Compared with traditional silicon-based and gallium arsenide-based semiconductor materials, wide-bandgap semiconductors (such as silicon carbide, gallium nitride, aluminum nitride, and indium nitride, etc.) have unique bandgap ranges, excellent optical and electrical properties The properties and excellent material properties can meet the working requirements of high-power, high-temperature, high-frequency and high-speed semiconductor devices, and have a wide range of applications in the automotive and aviation industries, medical care, communications, military, general l...

Claims

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Application Information

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IPC IPC(8): H01L21/02H01L21/78H01L29/06
CPCH01L21/02458H01L21/02513H01L21/0254H01L21/02634H01L21/02658H01L21/02694H01L21/7813H01L29/0684
Inventor 王颖慧罗晓菊
Owner 镓特半导体科技(上海)有限公司
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