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A Research Method for Multiple Degradation Processes in Electronic Systems

An electronic system and process technology, applied in the direction of electrical digital data processing, instruments, calculations, etc., can solve the problems of low reliability and life prediction results, large amount of calculation, complex research, etc., to reduce the amount of calculation and improve confidence degree, to ensure the effect of calculation accuracy

Active Publication Date: 2021-01-08
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The purpose of the present invention is to solve the problem that in the existing practical research, all the degradation quantities in the system are usually considered to analyze its degradation, resulting in a large amount of calculation and complicated research, and in order to optimize the analysis process, it is necessary to consider the main degradation quantities of the multi-degeneration system and ignore the secondary degradation. amount, which leads to the problem of low confidence in reliability and life prediction results, and a research method for multiple degradation processes in electronic systems is proposed

Method used

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  • A Research Method for Multiple Degradation Processes in Electronic Systems
  • A Research Method for Multiple Degradation Processes in Electronic Systems
  • A Research Method for Multiple Degradation Processes in Electronic Systems

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specific Embodiment approach 1

[0025] Specific implementation mode 1: The specific process of a method for researching multiple degradation processes of an electronic system in this implementation mode is as follows:

[0026] Step 1. Write the circuit equation to obtain the transfer function of the circuit; draw the amplitude-frequency characteristic curve and phase-frequency characteristic curve when all components of the circuit are degraded according to the frequency characteristics of the circuit; according to the amplitude-frequency characteristic curve and The phase-frequency characteristic curve obtains circuit characteristic information such as circuit gain, upper and lower limit cut-off frequency and center frequency when all components of the circuit are degraded;

[0027] Step 2: Perform sensitivity analysis using the transfer function obtained in Step 1, and divide key component combinations according to the ranking of sensitivity;

[0028] Step 3: Select key component combinations, obtain the a...

specific Embodiment approach 2

[0029] Embodiment 2: The difference between this embodiment and Embodiment 1 is that the circuit equation is written in the step 1 to obtain the transfer function of the circuit; according to the frequency characteristics of the circuit, the amplitude-frequency characteristics when all components of the circuit are degraded are drawn. curve and phase-frequency characteristic curve; according to the amplitude-frequency characteristic curve and phase-frequency characteristic curve when all components of the circuit are degraded, the circuit characteristic information such as circuit gain, upper and lower limit cut-off frequency and center frequency when all components of the circuit are degraded is obtained; the specific process is:

[0030] Write the circuit equation for the circuit to be studied, and obtain the transfer function of the circuit through calculation. The transfer function H(S) is the circuit output voltage V 0 with input voltage V i ratio;

[0031]

[0032] Amo...

specific Embodiment approach 3

[0038] Specific implementation mode three: combination figure 1 This embodiment is described. The difference between this embodiment and the specific embodiment 1 or 2 is that in the second step, the transfer function obtained in the step 1 is used for sensitivity analysis, and the combination of key components is divided according to the order of sensitivity; the specific process is:

[0039] The frequency characteristic H(jω) of the circuit is compared to a certain component R i Derivation, get the speed of frequency characteristic change, that is, R i The sensitivity of , the expression is:

[0040]

[0041] i is the number of components, 1≤i≤N, N is the total number of components;

[0042] Sort the sensitivity of the components according to the sensitivity from large to small. The components with the highest sensitivity are the first group of key component combinations, the top 2 with the highest sensitivity are the second group of key component combinations, and the ...

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Abstract

The invention relates to an electronic system multi-degeneration process researching method, aims to solve the problem that in existing actual research, all degeneration quantities in a system are generally considered to analyze their degeneration, large calculation amount is caused, the research is complicated, the main degeneration quantities of the multi-degeneration system needed to be considered while secondary degeneration quantities are ignored for optimizing the analysis process, and accordingly low reliability and low service life prediction result confidence degree are caused. The method comprises the steps that 1, a transfer function of a circuit is obtained, an amplitude-frequency characteristic curve and a phase-frequency characteristic curve when all the components of the circuit degenerate are drawn, and circuit gain, upper and lower limit stop frequencies when all the components of the circuit degenerate are obtained; 2, sensitivity analysis is performed, key component combinations are divided according to the sensitivity sorting situation; 3, the key component combinations are selected to perform circuit performance degeneration analysis. The electronic system multi-degeneration process researching method is used in the field of circuit degeneration.

Description

technical field [0001] The invention relates to a method for researching multiple degradation processes of an electronic system. Background technique [0002] During the use of analog circuits, the degradation effect is an inevitable effect that affects the service life of the system, and the continuous miniaturization of components and some special applications lead to the increasingly serious impact of the degradation effect on the reliability of the circuit system. In a multi-degradation process system, various types of passive components, such as resistors, capacitors, etc., all suffer from different time degradation effects, thus causing the circuit system composed of them to degrade with time. With the change of time and temperature, the resistance value of the resistor will drift seriously; the capacitor in the switching power supply will also seriously degrade due to its special working environment. These inevitable degradation effects often become the key factors t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/367G06F119/02
CPCG06F30/367G06F2119/04
Inventor 俞洋杨智明孙鹏关玥季雪松
Owner HARBIN INST OF TECH