CPT atomic clock control method

A control method and technology for atomic clocks, applied in the field of atomic clocks, can solve problems such as limiting the speed of scientific research and product development, consuming manpower and time costs, and lack of automatic control, so as to facilitate overall debugging and testing, facilitate positioning and resolution, and shorten R&D. effect of cycles

Active Publication Date: 2017-11-28
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Many domestic related researches are still in the state of desktop systems, without productization, and most of the control and debugging of the system are realized manually, lacking complete automatic control, requiring R&D personnel to track and debug at all tim...

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  • CPT atomic clock control method
  • CPT atomic clock control method
  • CPT atomic clock control method

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Embodiment Construction

[0029] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.

[0030] A CPT atomic clock control system uses a control chip for system control, and cooperates with peripheral circuit design to realize a CPT atomic clock with small volume, low power consumption and low cost. figure 1 A structural block diagram of a CPT atomic clock control system according to the present invention is shown, and the system includes a laser, a physical system, peripheral circuits and a control chip. figure 2 A detailed structural block diagram of a CPT atomic clock control system according to the presen...

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Abstract

The invention discloses a CPT atomic clock control method. The method is executed by a CPT atomic clock control system. The system comprises a laser, a physical system, a microwave frequency control module, a laser frequency control module, a temperature control module, a signal detection module, a magnetic field control module and a control chip. The method comprises steps of initializing the control chip, the laser, the physical system and all control modules; controlling the temperature of the laser and the physical system; scanning laser frequencies and detecting laser resonance signals; adjusting phase position of laser modulation signals; scanning microwave frequencies and detecting microwave resonance signals; and locking the microwave frequencies, detecting whether the microwave frequencies are unlocked and repeatedly detecting and judging whether the microwave frequencies and the laser frequencies are unlocked.

Description

technical field [0001] The invention relates to the field of atomic clocks. More specifically, it relates to a CPT atomic clock control method. Background technique [0002] Atomic clocks have different volumes, power consumption, and stability indicators due to different working principles and quantum state preparation requirements. In small-volume, low-power application scenarios, coherent population-trapped (CPT) atomic clocks have obvious advantages. Due to their unique working principles, they have received attention and a lot of research since they were proposed. For small-volume, low-power application scenarios, there are CPT atomic clock products based on different control chips on the market, namely CPT atomic clocks based on FPGA control and CPT atomic clocks based on single-chip microcomputer control, both of which require reasonable timing design and programming. The CPT atomic clock based on FPGA control has high control precision, but the power consumption an...

Claims

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Application Information

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IPC IPC(8): H03L7/26
CPCH03L7/26G04F5/145
Inventor 薛潇博杨仁福张振伟赵环王暖让陈星张旭
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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