Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and apparatus for removing mucous membrane from wafer

A wafer and mucous membrane technology, applied in the field of semiconductor wafers, can solve the problems of wafer edge contamination, narrow application range, easy contamination, etc., and achieve the effects of preventing edge contamination, wide application range and simple method

Active Publication Date: 2019-06-21
BEIJING TONGMEI XTAL TECH CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the film is removed by an automatic film removing machine, the surface of the wafer is easily contaminated by contact with the manipulator, and the automatic film removing equipment is expensive, inefficient and narrow in scope of application. Currently, it is only suitable for wafers with a diameter of more than 150 mm and a thickness of more than 400 μm.
When peeling off the film manually, the operator wears gloves and uses fingers across the wafer surface to hold the edge of the wafer, leaving glove marks easily, resulting in edge contamination of the wafer, and prone to deformation, which affects the quality of the wafer, and is not suitable for wafers with larger diameters

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and apparatus for removing mucous membrane from wafer
  • Method and apparatus for removing mucous membrane from wafer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] It should be understood that the following embodiments are only exemplary and do not limit the present invention. The protection scope of the present invention is defined by the claims. It should also be understood that in implementing the present invention, not all technical features in the following embodiments may be included, and there may be various combinations of these technical features.

[0019] In the present invention, unless otherwise stated, all operations are carried out at room temperature and normal pressure.

[0020] In the present invention, the surface of the wafer refers to the two surfaces with the largest area, and the dimension between the two surfaces is the thickness; the edge of the wafer refers to the outer edge of the two surfaces. When referring to "putting the wafer on a wafer support table in an inclined state", it means that the tangential direction of the wafer surface (ie, the direction perpendicular to the thickness of the wafer) is a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for stripping an adhesive film from a wafer. The method comprises the following steps of putting the wafer with the adhesive film on a wafer support table in an inclined state, wherein the wafer support table comprises a base and an inclined support surface for accommodating the wafer; stripping the adhesive film on the wafer from the edge of the wafer by using a blade; pressing the wafer on the wafer support table by using a press handle and simultaneously stripping the adhesive film from the wafer by using tweezers; and optionally, after putting the wafer with the adhesive film on the wafer support table in the inclined state and before stripping the adhesive film on the wafer from the edge of the wafer by using the blade, carrying out debonding treatment on the wafer with the adhesive film put on the wafer support table. The invention further relates to a device for stripping the adhesive film from the wafer.

Description

technical field [0001] The present invention relates to the field of semiconductor wafers, and more particularly, to methods and devices for removing adhesive films from semiconductor wafers. Background technique [0002] In the field of semiconductors, in the manufacture of substrate wafers (for example, after cutting out the rough wafer from the produced ingot, it is necessary to perform steps such as edging, grinding and polishing on the rough wafer) and subsequent epitaxial growth and thinning processing, storage and transportation. , it is possible to paste a mucous membrane on one or both sides of the wafer (that is, a mucous membrane formed by coating an adhesive on a plastic base film. After the mucous membrane is irradiated with light, the adhesive loses its viscosity; the commonly used mucous membrane is an ultraviolet (UV) film. The UV adhesive applied on the film loses its viscosity after being irradiated with ultraviolet light. The process of irradiating light t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/683
CPCH01L21/6836H01L2221/68386
Inventor 贺友华冯奎张有沐王元立朱颂义
Owner BEIJING TONGMEI XTAL TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products