Method of non-destructive testing of peak value voltage of infrared detector

An infrared detector and peak voltage technology, which is applied in the field of photoelectric detection, can solve the problems of sensitive element sheets being easily damaged, and achieve the effects of improving reliability and service life, high testing accuracy, and avoiding damage

Active Publication Date: 2018-01-19
BEIJING INST OF CONTROL ENG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem solved by the present invention is: to overcome the deficiencies of the prior art, provide a method for non-destructively testing the peak voltage of the infrared detector, and solve the problem that the sensitive element sheet of the infrared detector is easily damaged

Method used

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  • Method of non-destructive testing of peak value voltage of infrared detector
  • Method of non-destructive testing of peak value voltage of infrared detector
  • Method of non-destructive testing of peak value voltage of infrared detector

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Embodiment Construction

[0026] figure 2 It is a principle block diagram of the peak pressure non-destructive test of the present invention. like figure 2 As shown, this method mainly uses the principle that the thermistor-type infrared detector is powered on to generate thermal power consumption and the resistance value is reduced for testing. The DC power supply provides a stable DC voltage; the connector is a special plug-in special tooling adapted to the pins of the infrared detector, which is convenient for replacing the detector; in order to avoid over-current damage to the infrared detector, a current-limiting resistor is added to the circuit; a digital multimeter is used And set it as a voltage block to realize the real-time measurement of the working voltage at both ends of the detector; because the current value in the loop is very low, a picoammeter is used for real-time measurement of the working current in order to improve the test accuracy.

[0027] image 3 It is a flow chart of th...

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Abstract

The invention discloses a method of non-destructive testing of a peak value voltage of an infrared detector. The method includes the following steps: till a voltage of a universal meter is displayed to be 5+/-0.5V, recording reading of the universal meter and reading of a picoammeter at the moment, the readings being a first voltage V1 and a first current I1 respectively, and obtaining a first resistance R1 on the basis of the first voltage V1 and the first current I1; if the voltage of the universal meter is displayed to be above 30V, reducing an incremental step length of a DC power supply voltage to be 1V-3V, keeping recording the reading of the universal meter and the reading of the picoammeter, and obtaining in real time a resistance value R2' on the basis of the reading of the universal meter and the reading of the picoammeter; if R1/R2' equals 1.8-2.1, stopping increases of the DC power supply voltage and recording the reading of the universal meter and the reading of the picoammeter at the moment, the readings being a second voltage V2 and a second current I2 respectively, and obtaining a second resistance R2; obtaining a thermal resistance impedance Z of a sensitive element wafer of an infrared detector; and obtaining a peak value voltage VP of the sensitive element wafer of the infrared detector. The method solves the problem that the sensitive element wafer of the infrared detector is liable to be damaged.

Description

technical field [0001] The invention belongs to the field of photoelectric detection, in particular to a method for non-destructively testing the peak voltage of an infrared detector. Background technique [0002] When the thermistor-type infrared detector is used, an external bias voltage is applied, and the temperature sensitivity of the thermistor is used to change the magnitude of the current intensity in the circuit, thereby obtaining a corresponding electrical signal. For NTC thermistors, when the bias voltage applied to the thermistor is greater than the peak voltage, the resistance of the element will drop sharply, the current will increase rapidly, and the temperature will increase rapidly, which will cause the thermistor to burn out. Therefore, the peak voltage is an important basis for the user to select the bias voltage. The peak voltage of the thermistor can be measured using the volt-ampere characteristic. The volt-ampere characteristics of NTC thermistor are...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
Inventor 徐庆安邵逸恺袁鸣田广刘旭力吕志强崔爽宋泊威刘豫东宋志华
Owner BEIJING INST OF CONTROL ENG
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