Power transistor driver
A technology of power transistors and driving devices, which is applied in the direction of transistors, output power conversion devices, semiconductor devices, etc., and can solve the problem of shortening the conduction time of FETs
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no. 1 Embodiment approach
[0021] First, refer to Figure 1 ~ Figure 3 , the power transistor drive device 1 according to the first embodiment will be described. In this embodiment, if figure 1 As shown, the power transistor includes an insulated gate bipolar transistor (hereinafter referred to as IGBT) 20 and a field effect transistor (hereinafter referred to as FET) 30 connected in parallel to the IGBT 20 . That is, the emitter of IGBT20 and the source of FET30 are connected, and the collector of IGBT20 and the drain of FET30 are respectively connected. In addition, as FET30, MOSFET, JFET, HEMT etc. can be used, for example.
[0022] An IGBT gate drive circuit 11 is connected to the gate of the IGBT 20 , and the IGBT gate drive circuit 11 generates a voltage applied to the gate of the IGBT 20 in order to turn the IGBT 20 on or off in accordance with a drive signal supplied from the outside.
[0023] In addition, a FET gate drive circuit 13 is connected to the gate of the FET30, and the FET gate dr...
no. 2 Embodiment approach
[0045] Next, the power transistor drive device 1 according to the second embodiment will be described.
[0046] In the power transistor drive device 1 according to the first embodiment, the IGBT gate voltage monitoring circuit 12 detects that the IGBT 20 is turned on based on the gate voltage applied to the gate of the IGBT 20 .
[0047] Here, the on-threshold voltage and on-resistance of IGBT 20 vary somewhat depending on the ambient temperature. Therefore, in order to more accurately detect that IGBT20 is turned on based on the gate voltage of IGBT20, a temperature detection element (for example, a temperature-sensitive diode) for detecting the temperature of IGBT20 may be provided. Furthermore, the IGBT gate voltage monitoring circuit 12 may vary the FET conduction determination threshold voltage Vth in consideration of the temperature characteristics of the conduction threshold voltage and the conduction resistance of the IGBT 20 based on the temperature detected by the te...
no. 3 Embodiment approach
[0049] Next, the power transistor drive device 1 according to the third embodiment will be described. Figure 4 The structure of the power transistor drive device 1 of this embodiment is shown.
[0050] The configuration of the power transistor driving device 1 of the present embodiment overlaps with the configuration of the power transistor driving device 1 of the first embodiment in many parts. Therefore, the following description will focus on the different configurations, and omit the description of the redundant configurations.
[0051] First, as a first difference, in the present embodiment, the IGBT 20 has a structure in which a plurality of cells are connected in parallel, and the cells are divided into a large number of main cells 21 and a small number of sense (sense) cells 22 . The ratio of the main unit 21 to the readout unit 22 is set in advance. Therefore, when the IGBT 20 is turned on, most of the current flowing between the emitter and the collector of the IG...
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