Automatic diagnosis system for integrated circuit tester

Abstract

The invention relates to an automatic diagnosis system for an integrated circuit tester. The automatic diagnosis system comprises an external program-controlled digital meter, power supply automatic diagnosis and machine internal automatic diagnosis. In the power supply automatic diagnosis, impedance measurement is performed firstly, the program-controlled digital meter is placed in an impedance gear position, a relay is switched off, and testing is performed on circuits one after another until all the circuits are tested; results are compared with preset results, voltage measurement is performed if the results are all within the range, and the process of voltage measurement is the same as the process of resistance measurement; finally, all the test results are compared with a preset correct value range by upper computer software to obtain a diagnosis result; the machine internal automatic diagnosis is performed on the premise that the power source automatic diagnosis result has no problem; the machine internal automatic diagnosis includes storage unit automatic diagnosis, PE logic automatic diagnosis and PPMU simulation automatic diagnosis. By means of the system, manual measurement of each test point is not needed, test efficiency is improved, and the problems of short circuit and the like due to the fact that a test probe is in contact with the surrounding devices are avoided.

Description

technical field [0001] The invention relates to an automatic diagnosis system for integrated circuit testers, which is suitable for multi-channel integrated circuit testers and belongs to the field of channel testing of integrated circuit testers. Background technique [0002] In the current era of highly developed information technology, the semiconductor industry has experienced explosive growth. Semiconductor chips are inseparable from all walks of life, ranging from aircraft and satellites to small wearable devices. The integrated circuit tester is a special instrument for testing integrated circuit chips. Integrated circuit testing runs through the entire process of integrated circuit design, chip manufacturing, packaging and integrated circuit applications. The main purpose of the test is to ensure that the chip can fully realize the functions and performance indicators specified in the design specifications, and meet the needs of users after leaving the factory. ...

AI Technical Summary

Problems solved by technology

Now the tester generally has hundreds of channels, many of them reach K level, there are many power supplies, and the system is complicated

During R&D and production, it is laborious to manually debug the circuit. In order to improve the debugging efficiency, an automatic diagnosis system is now designed.

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