Flat panel detector and lag data sheet generation method and lag compensation correction method thereof
A flat-panel detector and correction method technology, which is applied in image data processing, instruments, semiconductor devices, etc., can solve problems such as inability to effectively eliminate complex afterimages, and achieve a wide range of applications
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Embodiment 1
[0046] see Figure 5 , the present invention provides a method for generating an afterimage data table, the steps at least include the following:
[0047] S1. Acquire n dark field images without X-ray exposure, where n≥4, and n is a positive integer;
[0048] S2. Adding and averaging the dark field images to obtain a dark field correction template, which is used to correct the background dark current noise of the image;
[0049] S3. Expose the flat panel detector at a set dose, and collect the current signal, wherein the set dose satisfies the condition: make both the readout circuit and the photodiode of the flat panel detector reach a saturated state;
[0050] S4. Select multiple time points t 1 , t 2 ,...t n The dark field images are collected separately, where the dark field images are correspondingly expressed as: D t1 ,D t2 ,…D tn ;
[0051] S5. Calculate the afterimage value, satisfying the condition: lag tn =D tn -offset, where lag tn for t n The afterimage...
Embodiment 2
[0056] see Figure 6 , the present invention also provides a method for compensating and correcting image sticking of a flat panel detector, the method for compensating and correcting image sticking at least includes the following steps:
[0057] S1', generate afterimage data table, and store in flat panel detector or detector software;
[0058] S2', acquiring the current bright field image and dark field image;
[0059] S3'. Correspond the afterimage signal of each pixel in the dark field image with the afterimage data table, find out the corresponding afterimage value of the afterimage signal of each pixel in the afterimage data table and the corresponding afterimage value moment;
[0060] S4', taking the moment corresponding to the afterimage value plus the time interval between the acquisition of the current bright-field image and the dark-field image as a new moment, and finding the afterimage value corresponding to the new moment in the afterimage data table, Generate...
Embodiment 3
[0070] see Figure 8 , the difference between this embodiment and Embodiment 2 is that the steps of obtaining the current bright field image and dark field image at least include the following:
[0071] S21", collecting a dark field image, wherein the dark field image contains a signal remaining from previous exposure, and the time for collecting the dark field image is any moment between the current exposure and the immediately preceding exposure;
[0072] S22", flat panel detector exposure;
[0073] S23", collecting a bright-field image, wherein the bright-field image includes a current exposure signal and a residual signal from a previous exposure.
[0074] It should be noted that in this embodiment, since the bright field image is collected after the dark field image, when querying the position corresponding to the afterimage signal of each pixel in the dark field image and the afterimage data table, The way to look up the table is to search from the front end to the bac...
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