Nonlinear measuring system capable of changing light intensity

Abstract

The invention discloses a nonlinear measuring system capable of changing light intensity. The nonlinear measuring system comprises a programmable laser, a stepping displacement platform and a controlbox, wherein a mirror machine is arranged above the programmable laser; a first aperture diaphragm is arranged on one side of the mirror machine; the stepping displacement platform is placed on one side of a first convex lens; a BS (Beam Splitter) prism is arranged on one side of the stepping displacement platform; a first detector is placed above the mirror machine; and one end of the first detector is connected with the control box by a wire. The nonlinear measuring system provided by the invention solves problems of influence on precision of nonlinear refractive coefficient, lack of measurement under Gaussian beams with different light intensities, lack of intelligence and automation, and lack of research on changes of a nonlinear absorption rate and a nonlinear refractive index of a substance under different light intensities by arranging structures such as the mirror machine, the first detector, the programmable laser, the control box, the first aperture diaphragm, a second aperture diaphragm, the BS prism and the stepping displacement platform.

Description

technical field [0001] The invention relates to the field of nonlinear optics and computer technology, in particular to a nonlinear measuring system capable of changing light intensity. Background technique [0002] Measuring the nonlinear refractive index and nonlinear absorption coefficient of materials is an important means of studying nonlinear optics. There are many traditional methods for measuring optical nonlinearity, such as nonlinear interference, degenerate four-wave mixing, near-degenerate three-wave mixing, Beam distortion measurement and other methods, these methods have high sensitivity, but cannot distinguish the positive and negative of the nonlinear refractive index, and the measurement device is complicated, so it is difficult to realize. The emergence of Z-scan technology is widely used because of its high sensitivity and simple device, which overcomes the difficulties of the above methods and has very important practical application value. The present in...

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Problems solved by technology

[0008] Aiming at the deficiencies of the prior art, the present invention provides a non-linear measurement system that can change the light intensity, which solves the problem of affecting the accuracy of the nonlinear refraction coefficient, lack of measurement under Gaussian beams with different light intensities, insufficient intelligence and automation And there is no research on the change of the nonlinear absorption rate and nonlinear refractive index of the material under different light intensities

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