Contact type three-dimensional tracking scanning probe

A technology of three-dimensional tracking and scanning probe, which is applied in the direction of measuring devices, instruments, etc., can solve the problems of continuous and fast tracking of curvature, difficult processing, damage of measuring equipment, etc., and achieve simple and practical mechanical decoupling and good dynamic response performance , the effect of improving the service life

Inactive Publication Date: 2018-09-04
SICHUAN UNIV
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Problems solved by technology

The scanning probe has a higher measurement speed than the trigger probe, and is suitable for precise and efficient measurement of the overall profile of large and complex curved parts. Orthogonal parallel guide mechanism leads to bulky probe, difficult processing, and high manufacturing cost; moreover, due to the complex and bulky structure, the dynamic response performance of the probe is poor, and it is impossible to continuously and quickly track curved surface parts with large curvature mutations. Very prone to collision and demoulding
[0003] Chinese patent ZL 201310296616.3 discloses a contact-type three-dimensional scanning probe. The probe adopts a serial guiding mechanism composed of multiple sets of parallel reeds. The mechanical structure is complex, the space utilization rate is low, and the volume is large. Affected by other two-direction measuring devices, its performance is unstable and its accuracy is low; the device does not have a limit mechanism to prevent the probe from swinging beyond the limit position, and cannot effectively protect the probe, so that when the probe meets the workpiece, the friction coefficient is too large When there are unfavorable factors such as unsmooth or curved surfaces, overpressure, mold release and vibration will occur, and even damage to the measuring equipment will occur.

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Embodiment Construction

[0040] The contact-type three-dimensional tracking scanning probe, its usage method and measuring principle of the present invention will be further described through the embodiments and with reference to the accompanying drawings.

[0041] The contact-type three-dimensional tracking scanning probe described in this embodiment is a component of the three-coordinate measuring machine, and is installed on the three-coordinate measuring machine when in use.

[0042] The structure of the contact type described in this embodiment is as follows: figure 1 As shown, it consists of a motion unit, a sensing unit, a limit unit, a signal processing unit 18 and an installation system for installing the motion unit, a sensing unit, a limit unit, and a signal processing unit.

[0043] The motor unit such as figure 1 , image 3 As shown, it includes probe 1, lower moving plate 2, lower return mechanism 3, lower fixing plate 4, Z-direction transmission mechanism 5, X-direction transmission m...

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Abstract

The invention relates to a contact type three-dimensional tracking scanning probe. The contact type three-dimensional tracking scanning probe is composed of a motion unit, a sensing unit, a limiting unit, a signal processing unit and an installation system; the motion unit includes a probe, a lower motion plate, a lower returning mechanism, a Z-direction transmission mechanism, an X-direction transmission mechanism, a Y-direction transmission mechanism, an upper motion plate and an upper returning mechanism; the sensing unit is composed of a Z-direction linear displacement sensor, an X-direction linear displacement sensor and a Y-direction linear displacement sensor; and the center lines of the three sensors are parallel to each other, and the connection lines of the centers of the cross-sections of the three sensors form an isosceles right-angled triangle. The displacement of a ball at the tail end of the probe along an X, Y and Z direction is acquired through the three sensors and isconverted into electrical signal output through the three sensors, and therefore, simple and practical mechanical decoupling can be realized. The probe has the advantages of high space utilization rate, small size, simple structure, excellent dynamic response performance and capability of measuring the size of the contour of a large-sized complicated curved part and improving measurement accuracy.

Description

technical field [0001] The invention belongs to the field of workpiece coordinate scanning measurement, and relates to a contact type three-dimensional tracking scanning measuring head used on a three-coordinate measuring machine or a numerical control machining center. Background technique [0002] In the field of modern manufacturing, there is a great demand for efficient and precise measurement of the profile dimensions of large and complex curved parts. Usually, a three-coordinate measuring machine is used to measure the profile of the workpiece surface to obtain the three-dimensional coordinate parameters of each point on the surface of the workpiece. In the three-coordinate measuring machine, the core component is the measuring probe (probe for short) used to detect the surface of the workpiece. The probes can be divided into two types: contact probes and non-contact probes, and contact probes can be subdivided into trigger probes and scanning probes. The scanning pro...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B21/04
CPCG01B21/04
Inventor 陶冶李彦赵武李文强李翔龙熊艳王凯万浩于泽源吴年汉
Owner SICHUAN UNIV
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