MEMS (Micro-electromechanical System) device and production method thereof
A manufacturing method and device technology, applied in chemical instruments and methods, separation methods, instruments, etc., can solve the problems of high cost and complicated MEMS device manufacturing process, and achieve the effect of reducing production cost and simplifying manufacturing process.
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Embodiment 1
[0066] Refer below Figure 2A-Figure 2E ,in Figures 2A-2D is a schematic cross-sectional view of a device respectively obtained by sequentially implementing the steps of the method according to Exemplary Embodiment 1 of the present invention. Figure 2E is a schematic top view of the device obtained by the method according to Exemplary Embodiment 1 of the present invention.
[0067] The invention provides a method for preparing a MEMS device, such as Figure 6 As shown, the main steps of the preparation method include:
[0068] Step S601: providing a MEMS wafer;
[0069] Step S602: forming a filter layer on the front surface of the MEMS wafer;
[0070] Step S603: forming several filter holes in the filter layer;
[0071] Step S604: etching the MEMS wafer through the filter hole to form a groove in the MEMS wafer below the filter hole;
[0072] Step S605: Thinning the MEMS wafer on the back side to expose the filter holes.
[0073] In the following, specific implementat...
Embodiment 2
[0090] Refer below Figure 3A-Figure 3E ,in Figure 3A-3D It is a schematic cross-sectional view of devices respectively obtained by sequentially implementing the steps of the method according to the second exemplary embodiment of the present invention. Figure 3E is a schematic top view of the device obtained by the method according to the second exemplary embodiment of the present invention.
[0091] First, execute step S601, such as Figure 3A As shown, a MEMS wafer 300 is provided.
[0092] Exemplarily, the MEMS wafer 300 may be at least one of the materials mentioned below: single crystal silicon, silicon-on-insulator (SOI), silicon-on-insulator (SSOI), silicon-germanium-on-insulator ( S-SiGeOI), silicon germanium on insulator (SiGeOI) and germanium on insulator (GeOI), etc.
[0093] As the size of the filter screen increases, the filter screen structure made according to the method of Embodiment 1 is prone to damage and the reliability is reduced. In order to further...
Embodiment 3
[0108] Refer below Figure 4A-Figure 4F ,in Figures 4A-4E It is a schematic cross-sectional view of devices respectively obtained by sequentially implementing the steps of the method according to the third exemplary embodiment of the present invention. Figure 4F is a schematic top view of the device obtained by the method according to the third exemplary embodiment of the present invention.
[0109] First, execute step S601, such as Figure 4A As shown, a MEMS wafer 400 is provided.
[0110] Exemplarily, the MEMS wafer 400 may be at least one of the materials mentioned below: single crystal silicon, silicon-on-insulator (SOI), silicon-on-insulator (SSOI), silicon-germanium-on-insulator ( S-SiGeOI), silicon germanium on insulator (SiGeOI) and germanium on insulator (GeOI), etc.
[0111] Next, execute step S602, such as Figure 4A As shown, a filter layer 402 is formed on the front side of the MEMS wafer 200 . The filter layer 402 includes a polyimide layer.
[0112] Ex...
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