Digital power supply circuit based on MEMS sensor

Abstract

The invention provides a digital power supply circuit based on an MEMS sensor. The invention relates to the field of circuit testing technology and settles technical problems such as high power consumption and low stability of a current source and a large number of pulse noises and low versatility in a ring oscillator in prior art. The digital power supply circuit comprises a high-precision oscillating circuit; a multi-current-mirror circuit which outputs current with fixed bias; a single-pulse generating circuit which outputs AC current pulses; a buffer frequency matching circuit which receives the AC current pulses that are output from the single-pulse generating circuit; a reference MEMS sensor which outputs a feedback reference clock with a timing loop performance characteristic; a first to-be-tested MEMS sensor which receives a first square-wave pulse sequence and outputs a first feedback clock with the timing loop performance characteristic; and a second to-be-tested MEMS sensorwhich receives a second square-wave pulse sequence and outputs a second feedback clock with the timing loop performance characteristic.

Description

technical field [0001] The invention relates to the technical field of circuit testing, in particular to a digital power supply circuit based on MEMS sensors. Background technique [0002] The pulses that the sequential circuit needs to process are alternating current pulses with a large dynamic range. The mainstream test method is to directly connect the MEMS power supply for testing. However, the current mainstream test equipment is not equipped with a high-speed AC current pulse source, so it is difficult to perform AC signal testing during the mass production sampling test of MEMS sensors. Some manufacturers give up AC testing because of this, and only conduct DC testing during mass production testing, resulting in insufficient testing of chip matching capability and tolerance, and greatly reducing test coverage. In order to ensure the test coverage, some manufacturers purchase customized special test pulse sources, but the cost of custom test equipment is high, which ...

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Problems solved by technology

[0004] For the above-mentioned prior art, the purpose of the present invention is to provide, to solve the problem that the prior art cannot detect multiple MEMS sensors at the same time, its current source has high power consumption and poor stability, and there is a large amount of pulse noise in the prior art loop oscillator and its versatility is low and other technical issues

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