Detection system and method for measuring electron relative light yield of scintillator to be tested
A detection system and scintillator technology, which is applied in the field of radiation measurement, can solve the problems of inaccurate measurement and the influence of X-ray escape on electron light yield measurement, and achieve the effect of simple structure, concise and efficient method, and improved detection efficiency
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[0045] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0046] Such as figure 1As shown, this embodiment provides a detection system for measuring the relative light yield of scintillator electrons to be tested, including a gamma radiation source 1, a front-end lead collimator 2, a front-end detector, and a rear-end lead collimator 5 , the back-end detector and the oscilloscope 3 with waveform conforming function; the front-end detector includes the first photomultiplier tube 4; the back-end detector includes the second scintillator (not shown in the figure) and the second photomultiplier tube 6; the front-end detector The thickness of the lead collimator 2 is more than or equal to 20cm, and the diameter of its collimation hole is less than or equal to 5mm. The thickness of the rear-end vertical collimator 5 is ≥10cm, and the diameter of the collimation hole is ≤10mm.
[0047] The front-end lead ...
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