Maximum temperature measuring method based on lattice parameter changes of micro crystal
A technology of lattice parameters and micro-crystals, applied in thermometers, measuring devices, measuring heat, etc., can solve the problems of difficult surface temperature testing of complex workpieces, and achieve high defect recovery sensitivity, good symmetry, and accurate temperature measurement results.
Active Publication Date: 2018-12-18
AVIC BEIJING CHANGCHENG AVIATION MEASUREMENT & CONTROL TECH INST +2
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[0004] The purpose of the present invention is to overcome the above-mentioned deficiencies in the prior art, propose and design a method for measuring the maximum temperature based on the change of micro-crystal lattice parameters, aiming to solve the problem of difficult surface temperature measurement of complex workpieces in the current high-temperature environment
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[0030] Below in conjunction with accompanying drawing and example the patent of the present invention is described in further detail.
[0031] The method for measuring the surface temperature field of a complex workpiece under a high-temperature environment proposed by the technical solution of the present invention is to obtain a temperature distribution nephogram of the outer surface of the workpiece by installing micro crystals on the surface of the workpiece. The specific implementation steps are:
[0032] 1. The structure of 3C-SiC crystal is as follows: figure 2 As shown, nitrogen impurities are doped during the growth process, and the nitrogen doping concentration is 10 18 / cm 3 , prepare 0.35mm thick nitrogen-doped 3C-SiC crystal;
[0033] 2. Carry out X-ray single crystal diffraction detection on 3C-SiC crystal, measure its lattice parameters, and calculate the original lattice volume;
[0034] 3. When 3C-SiC crystal is irradiated with neutrons, atoms undergo a la...
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The invention provides a maximum temperature measuring method based on lattice parameter changes of micro crystal, and the method is a special temperature measurement technology which detects the lattice parameter changes of the micro crystal and obtains the maximum temperature of a tested workpiece under the conditions that a surface state of the workpiece is not damaged and normal operation of the workpiece is not influenced. The method comprises the following steps of: carrying out micro cutting processing on the nitrogen-doped 3C-SiC crystal after neutron irradiation; performing the high-temperature annealing processing on the micro crystal at different temperatures and different times, measuring the lattice parameters of the micro crystal, and drawing a temperature measurement calibration curve of the "temperature-time-lattice volume expansion rate"; mounting the micro crystal on a surface of the tested workpiece during use; taking out micro crystal temperature sensors and measuring the lattice parameters after the normal operation of the workpiece; obtaining the maximum temperature experienced by the tested point by searching the temperature corresponding to the heating timeand the lattice volume expansion rate in the temperature measurement calibration curve; and obtaining a measurement result of the maximum temperature field of the workpiece surface by mounting a plurality of micro crystal temperature sensors in a key temperature measurement area.
Description
technical field [0001] The invention relates to a method for measuring the highest temperature based on the variation of micro-crystal lattice parameters, and belongs to the technical field of high-temperature measurement and testing. This measurement method is realized without destroying the surface state of the workpiece and without affecting the normal operation of the workpiece. This method is a special temperature measurement technology that obtains the highest temperature of the workpiece by detecting the change of the micro-crystal lattice parameters. Background technique [0002] Since the 21st century, with the rapid development of science and technology and the defense industry, a series of high-tech products have put forward lighter, smaller and non-embedded requirements for temperature test sensors. For example, in the field of aerospace, because the engine needs to measure a large amount of data in a large number of tests such as the whole machine test, durabili...
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IPC IPC(8): G01N25/00G01N23/207G01K7/02
CPCG01K7/02G01N23/207G01N25/00
Inventor 刘德峰李欣黄漫国王燕山张梅菊高云端梁晓波
Owner AVIC BEIJING CHANGCHENG AVIATION MEASUREMENT & CONTROL TECH INST