Unlock instant, AI-driven research and patent intelligence for your innovation.

Schottky diode and manufacturing method thereof

A technology of Schottky diode and Schottky contact, which is applied in the direction of diode, semiconductor/solid-state device manufacturing, electrical components, etc., can solve the problems of low efficiency and limitation, and achieve the effect of optimizing VF characteristics

Inactive Publication Date: 2018-12-18
SHENZHEN JING XIANG TECH CO LTD
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But until recently, silicon-based Schottky diodes for most applications were limited to operating voltages below 100V
Historically, the reverse blocking voltage of Schottky diodes has been limited by voltages much lower than 200V
This is partly due to the fact that when the reverse blocking capability is close to 200V, the forward voltage drop or forward conduction voltage (VF) of the Schottky diode will be close to the forward voltage drop of the PIN diode, making it less efficient in the application

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Schottky diode and manufacturing method thereof
  • Schottky diode and manufacturing method thereof
  • Schottky diode and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0026] Such as figure 1 As shown, an embodiment of the present invention provides a schematic cross-sectional schematic diagram of a local structure of the active region of a Schottky diode 100. The Schottky diode 100 mainly includes: a silicon epitaxial wafer 110, an oxide layer 120, a polysilicon layer 130, a dielectric layer 140, anode me...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of semiconductor devices, and provides a Schottky diode and a manufacturing method thereof. The Schottky diode comprises a silicon epitaxial wafer where aplurality of trenches are formed, and openings of the plurality of trenches facing the upper surface of the silicon epitaxial wafer; an oxide layer covering an inner surface of the plurality of trenches; a polysilicon layer that fills a space of the plurality of trenches other than the oxide layer; a dielectric layer arranged on the upper surface of the silicon epitaxial wafer; an anode metal layer disposed on the dielectric layer and extending into a Schottky contact hole to cover a bottom of the Schottky contact hole, wherein the Schottky contact hole penetrates the dielectric layer; and a cathode metal layer arranged on the lower surface of the silicon epitaxial wafer; wherein the projection of the Schottky contact hole on the silicon epitaxial wafer and the projection of the dielectriclayer on the silicon epitaxial wafer cover at least one of the trenches. The Schottky diode of the present invention can optimize a device structure and VF characteristics.

Description

technical field [0001] The invention relates to the technical field of semiconductor devices, in particular to a Schottky diode and a manufacturing method of the Schottky diode. Background technique [0002] Schottky diodes are generally a better choice for high frequency electronic applications where low forward conduction energy loss is critical due to their high switching speed and low forward (on-state) voltage drop. But until recently, silicon-based Schottky diodes for most applications were limited to operating voltages below 100V. Traditionally, the reverse blocking voltage of Schottky diodes has been limited by voltages much lower than 200V. This is partly due to the fact that when the reverse blocking capability is close to 200V, the forward voltage drop or forward conduction voltage (VF) of the Schottky diode will be close to the forward voltage drop of the PIN diode, making it less efficient in the application . Therefore, it is necessary to propose a Schottky ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L29/872H01L29/06H01L21/329
CPCH01L29/8725H01L29/0623H01L29/66212
Inventor 刘美华林信南刘岩军
Owner SHENZHEN JING XIANG TECH CO LTD