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Semiconductor structure and forming method thereof

A semiconductor and gate structure technology, applied in the field of semiconductor structures and their formation, can solve the problems of poor electrical properties of semiconductor structures, and achieve the effects of high density, low cost and improved quality

Inactive Publication Date: 2019-01-04
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, after the introduction of the fluid chemical vapor deposition process, the formed semiconductor structure often has poor electrical properties.

Method used

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  • Semiconductor structure and forming method thereof
  • Semiconductor structure and forming method thereof
  • Semiconductor structure and forming method thereof

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Embodiment Construction

[0035] It can be seen from the background art that after the fluid chemical vapor deposition process is introduced, the formed semiconductor structure often has the problem of poor electrical performance. Combining with the formation process of a semiconductor structure, the reasons for its poor electrical performance are analyzed:

[0036] refer to Figure 1 to Figure 3 , shows a schematic cross-sectional structure corresponding to each step in the process of forming a semiconductor structure.

[0037] refer to figure 1 , forming the substrate 10 .

[0038] The step of forming the base 10 includes: providing a substrate 11 with a fin 12 on the substrate 11; forming a gate structure 14 on the fin 12; A source-drain doped region 15 is formed.

[0039] refer to figure 2 , forming a fluidized layer on the substrate 10, and curing the fluidized layer to form a precursor medium layer 21; refer to image 3 , performing annealing treatment 23 on the precursor dielectric layer ...

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Abstract

A semiconductor structure and a forming method thereof are provided, the forming method comprising: forming a substrate; forming a precursor dielectric layer on the substrate; The precursor dielectriclayer is densely implanted to form an interlayer dielectric layer. The dense injection process can drive H release in the precursor dielectric layer, thereby facilitating the improvement of the density of the interlayer dielectric layer and effectively improving the performance of the interlayer dielectric layer; And the process temperature can be effectively controlled by the method of dense injection treatment to drive the H release, thereby facilitating the control of the thermal budget and effectively reducing the influence of the interlayer dielectric layer formation process on other semiconductor structures; Therefore, the technical proposal of the invention can improve the density of the interlayer dielectric layer on the premise of controlling the thermal budget, can realize boththe density improvement and the thermal budget reduction, and is favorable for improving the electrical performance of the formed semiconductor structure.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a semiconductor structure and a forming method thereof. Background technique [0002] With the rapid development of semiconductor manufacturing technology and the continuous development of integrated circuit manufacturing technology, people's requirements for the integration and performance of integrated circuits are becoming higher and higher. Semiconductor devices are developing toward higher element density and higher integration. In order to improve integration and reduce costs, the critical dimensions of components are getting smaller and smaller, and the density of components and circuits inside integrated circuits is increasing. This development makes the spacing between adjacent components and adjacent circuits Getting smaller and smaller. [0003] In semiconductor manufacturing technology, electrical isolation is usually achieved between adjacent components a...

Claims

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Application Information

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IPC IPC(8): H01L21/8238H01L21/3105H01L27/092
CPCH01L21/3105H01L21/823821H01L27/0924
Inventor 周飞
Owner SEMICON MFG INT (SHANGHAI) CORP