Unlock instant, AI-driven research and patent intelligence for your innovation.
Sampling position error correction method and device in antenna spherical near-field measurement
What is Al technical title?
Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
An error correction, sampling location technology, applied in design optimization/simulation, special data processing applications, etc., can solve problems such as trouble, and achieve the effect of solving near-field data errors
Active Publication Date: 2020-09-29
BEIJING UNIV OF POSTS & TELECOMM
View PDF4 Cites 0 Cited by
Summary
Abstract
Description
Claims
Application Information
AI Technical Summary
This helps you quickly interpret patents by identifying the three key elements:
Problems solved by technology
Method used
Benefits of technology
Problems solved by technology
However, since this correction method is mainly aimed at mechanical errors, the correction effect is better for larger mechanical errors, and it is no longer applicable for smaller errors. better solution
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more
Image
Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
Click on the blue label to locate the original text in one second.
Reading with bidirectional positioning of images and text.
Smart Image
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 1
[0053] Embodiment 1 of the present invention provides a sampling position error correction method in antenna spherical near-field measurement, see figure 2 shown, including steps:
[0054] In step S100, spherical near-field measurement is performed on the antenna under test, an antenna model is established, and error near-field data with position errors are acquired.
[0055] Step S101, calculating the biased spherical wave mode coefficient through the error near-field data;
[0056] Step S102, correcting the spherical mode coefficients by Taylor series to obtain corrected spherical mode coefficients.
[0057] Since the position error of the near-field sampling point has a certain influence on the converted far-field radiation characteristics, it is necessary to correct the near-field data. Moreover, it is found through research that the transmission point affected by this error is the spherical wave mode coefficient, so the main correction is carried out on the basis of th...
Embodiment 2
[0059] Embodiment 2 of the present invention provides a preferred implementation of a method for correcting sampling position errors in antenna spherical near-field measurement.
[0060] join image 3 As shown, the method includes the steps of:
[0061] Step S200, establishing an antenna model in HFSS.
[0062] Adopt horn antenna in the embodiment of the present invention two as AUT (Antenna Under the Test, tested antenna), will set up this antenna model in HFSS (High Frequency Structure Simulator, high frequency structure simulator), this antenna has stronger radiation characteristic.
[0063] Step S201, constructing a target far-field radiation pattern of the antenna under test.
[0064] In the second embodiment, the far-field radiation pattern of the target antenna can be directly simulated by HFSS, which is an ideal far-field radiation characteristic of the antenna.
[0065] Step S202, acquiring error near-field data with position error of the antenna under test.
[0...
Embodiment 3
[0092] Embodiment 3 of the present invention provides a sampling position error correction device in antenna spherical near-field measurement, including a measurement simulation module, a wave mode coefficient module and a Taylor correction module.
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
PUM
Login to View More
Abstract
A method and apparatus for calibrating sampling position error in spherical near-field measurement of antenna include measuring spherical near-field measurement of measured antenna, establishing antenna model, and obtaining error near-field data with position error. The biased spherical wave mode coefficients are obtained from the error near-field data. The spherical wave mode coefficients are corrected by Taylor series, and the corrected spherical wave mode coefficients are obtained. The device comprises a measurement simulation module, a wave mode coefficient module and a Taylor correction module. The invention relates to a sampling position errorcorrection method and device for antenna spherical near-field measurement, by applying the Taylor series method to the correction of the sampling position error of the antenna spherical near-field measurement, the near-field data caused by the sampling position error can be corrected effectively, and the far-field result of the conversion which is closer to the ideal far-field radiation characteristic can be obtained.
Description
technical field [0001] The invention relates to the technical field of antenna measurement, in particular to a method and device for correcting sampling position errors in antenna spherical near-field measurement. Background technique [0002] In recent years, the rapid development of mobile communication has promoted the research and development of base station antennas, and antennas are becoming more and more important, and the requirements for the accuracy of antenna design are getting higher and higher. Especially with the introduction of large-scale multiple-input multiple-output technology in 5G, a large number of antennas need to be added near the base station at the communication end. Due to the large increase in the number of antennas, the communication performance of the system has been significantly improved. The antenna performs beamforming in the horizontal and vertical directions, so it can communicate within the range of different floors of the building or use...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
Application Information
Patent Timeline
Application Date:The date an application was filed.
Publication Date:The date a patent or application was officially published.
First Publication Date:The earliest publication date of a patent with the same application number.
Issue Date:Publication date of the patent grant document.
PCT Entry Date:The Entry date of PCT National Phase.
Estimated Expiry Date:The statutory expiry date of a patent right according to the Patent Law, and it is the longest term of protection that the patent right can achieve without the termination of the patent right due to other reasons(Term extension factor has been taken into account ).
Invalid Date:Actual expiry date is based on effective date or publication date of legal transaction data of invalid patent.
Login to View More 
Login to View More