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A near-infrared polarization spectroscopy testing device and method

A technology of polarization spectrum and test device, which is applied in polarization spectrum, spectrum investigation and other directions, can solve the problems of unable to meet the polarization spectrum test of narrow-band optical signal, unable to realize the test of narrow-band polarization spectrum information, etc.

Active Publication Date: 2020-12-01
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Application Information

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Problems solved by technology

However, since the channel modulation technology can only test the wide-band Stokes polarization spectrum information, it cannot realize the narrow-bandwidth polarization spectrum information test, so it cannot meet the polarization spectrum test of narrow-band optical signals such as laser light source and DWDM combined light source in high-speed optical communication.

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  • A near-infrared polarization spectroscopy testing device and method
  • A near-infrared polarization spectroscopy testing device and method
  • A near-infrared polarization spectroscopy testing device and method

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Embodiment Construction

[0020] The specific embodiment of the present invention will be further described below in conjunction with accompanying drawing and specific embodiment:

[0021] Such as figure 1 As shown, a near-infrared polarization spectrum test device includes a collimating objective lens 1, a high-speed polarization modulation component 2, a converging objective lens 3 and an infrared scanning monochromator 4 placed sequentially along the optical path direction, and the high-speed polarization modulation component 2 and infrared scanning monochromator 4 The scanning monochromator 4 is connected to the control and data processing system 5, and the high-speed polarization modulation component 2 includes a first liquid crystal modulation phase retarder 21, a second liquid crystal modulation phase retarder 22 and a near-infrared polarizer 23 arranged in sequence along the optical axis The infrared scanning monochromator 4 includes an incident slit 41, a polarizing beam splitter 42, a wide-sp...

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Abstract

The invention discloses a near-infrared polarization spectrum test device and method, specifically relates to the field of optical communication of a near-infrared waveband, and solves the defect thata conventional channel modulation technology fails to satisfy polarization spectrum tests of narrow-band optical signals of laser sources and DWDM combined light sources in high-speed optical communication. The near-infrared polarization spectrum test device comprises a collimating objective lens, a high-speed polarization modulation assembly, a collecting objective lens and an infrared scanningmonochromator arranged in sequence along the direction of an optical path, the high-speed polarization modulation assembly and the infrared scanning monochromator are connected with a control and dataprocessing system, the high-speed polarization modulation assembly comprises a first liquid crystal modulation phase retarder, a second liquid crystal modulation phase retarder and a near-infrared polaroid arranged in sequence along an optical axis, and the infrared scanning monochromator comprises an incidence slit, a polarizing beam splitter, a wide-spectrum-band quarter-wave plate, a reflective collimating objective lens, a planar holographic grating, a rotation stepping motor, a reflective collecting objective lens, a reflection slit and a single-point detector arranged in sequence alongthe optical axis.

Description

technical field [0001] The invention relates to the field of optical communication in the near-infrared band, in particular to a near-infrared polarization spectrum testing device and method. Background technique [0002] In the field of optical communication in the near-infrared band, with the development of wavelength division multiplexing, polarization multiplexing, and orthogonal frequency division multiplexing technology, the light wave modulation technology is becoming more and more complex, and the difference of the light wave carrier corresponding to each signal is more and more subdivided. From spectral frequency difference to polarization spectral frequency difference. This puts forward a demand for the polarization spectrum test of light waves. Existing detection equipment such as spectrum analyzers, extinction ratio testers, and polarimeters can only test single-dimensional light wave information, and the test data can only reflect spectral information or polari...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/447
CPCG01J3/447
Inventor 孟鑫韩顺利刘磊张冰江升李志增
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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