A Method for Improving the Quality of Modeling Spectrum of Near Infrared Spectroscopy Analysis Technology
A near-infrared spectroscopy and construction method technology is applied in the field of improving the modeling and prediction capabilities of near-infrared spectroscopy based on "data averaging", which can solve the problems of poor spectral quality and low spectral signal-to-noise ratio, and achieve good accuracy and improve effect, improve the possible effect of later staged production and intelligent production
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0037] Fourier transform near-infrared spectroscopy (FT-NIR) was used to collect the spectra of 20 raw human plasma samples involved in the modeling, and 15 spectra were collected in parallel for each sample. Using Fourier transform near-infrared spectrometer (FT-NIR) liquid temperature-controlled transmission sampling module, the temperature is controlled at 37°C to collect the spectrum of raw human plasma samples. The spectral scanning range is 10000-4000cm -1 , the number of scans is 32, and the resolution is 8cm -1 , collected with air as a reference, and corrected the background every 1 hour. The laboratory environment is a temperature of 26° C. and a humidity of 30%. Each sample spectrum has a total of 1557 wavenumber points. After removing the wavenumber points with large noise and weak signal, 1200 wavenumber points remain.
[0038] For the 15 spectra of each sample, there are 15 similar absorbance values at each wave number point of each sample, and the differenc...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



