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Base station air interface throughput performance test method, device and system

A test method and base station configuration technology, applied in the field of communication, can solve the problems of low test accuracy and low test efficiency, and achieve the effects of saving test labor costs, improving test quality and test efficiency, and reducing error rates

Inactive Publication Date: 2019-04-09
COMBA TELECOM SYST CHINA LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Based on this, it is necessary to provide a base station test method, device and system for the problems of low test efficiency and low test accuracy in traditional test conditions

Method used

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  • Base station air interface throughput performance test method, device and system
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  • Base station air interface throughput performance test method, device and system

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Embodiment Construction

[0037] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. A preferred embodiment of the application is shown in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0038] It should be noted that when an element is considered to be "connected" to another element, it may be directly connected to and integrally integrated with the other element, or there may be an intervening element at the same time.

[0039] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in th...

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Abstract

The invention relates to a base station air interface throughput performance testing method, device and system. The base station air interface throughput performance testing method comprises the stepsof acquiring current scene data to be sent from a preset scene library, and sending a base station configuration instruction generated according to the scene data to a base station to be tested; wherein the base station configuration instruction is used for indicating the base station to be tested to configure system parameters of the base station according to the scene data; starting a test taskbased on the scene data, and obtaining a throughput performance test result of the configured base station to be tested under the scene data; and traversing the scene library until a throughput performance test result of the base station to be tested under each scene data is obtained. Based on method, test scenes configured by various parameters of a base station to be tested can be traversed. Compared with a traditional test technology, the method has the advantages that full test can be achieved, the test quality and test efficiency of base station products are improved, and the error rateof a test process of traversing the scene library is reduced. Meanwhile, the testing process is automatic, the testing efficiency is remarkably improved, and a large amount of testing labor cost is saved.

Description

technical field [0001] The present application relates to the communication field, in particular to a method, device and system for testing air interface throughput performance of a base station. Background technique [0002] Air interface throughput performance is an important indicator to measure the performance of LTE (Long Term Evolution, Long Term Evolution) base station. In different stages of the design, development and release of base station products, it is often necessary to detect and analyze the air interface throughput performance to provide a basis for product performance. Bottleneck analysis and application improvement provide important information references. [0003] During the implementation process, the inventor found at least the following problems in the traditional technology: under the traditional test conditions, the test takes a long time and is prone to errors, resulting in low test efficiency and low test accuracy. Contents of the invention [0...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04W24/08H04L12/26
CPCH04L43/0888H04W24/08
Inventor 邱桥春吴巧健张元鑫程忠钱丽萍曾晓俊
Owner COMBA TELECOM SYST CHINA LTD
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