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Fault isolation rate distribution method

A technology of fault isolation rate and allocation method, applied in the field of fault detection rate allocation, it can solve the problems that affect the test design results, the allocation results are very different, and the two skins are easy to understand, the allocation results are reasonable, and the algorithm is simple. Effect

Active Publication Date: 2019-04-16
XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

Different designers have different understandings of the allocation method and the design itself, which often make their respective allocation results differ greatly, resulting in a mismatch between the test allocation results and the test design work, forming "two skins". "Phenomenon, which directly affects the results of testable design

Method used

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Embodiment Construction

[0041] Take a system as an example, the system contains 5 sub-systems, the fault detection rate is 90%, and the fault isolation rate is 90%. Find the assigned value of the fault isolation rate of each sub-system.

[0042] According to the system reliability distribution results, the mean time between failures (MFHBF) of each system can be obtained, and the reciprocal of MPHBF is the failure rate of each system, as shown in Table 1.

[0043] Table 1 Reliability distribution results

[0044] Serial number

name

Mean time between failures (hours)

λ i

1

Subsystem 1

160

0.00625

2

Subsystem 2

80

0.0125

3

Subsystem 3

700

0.001429

4

Subsystem 4

300

0.003333

5

Subsystem 5

280

0.003571

[0045] According to the failure mode and impact analysis results, the number of failure modes shown in Table 2 is obtained.

[0046] Table 2 Results of failure modes

[0047]

[0048]

[0049] According to the maintainability index distribution, the maintainability distribution results shown in Table 3 are obt...

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Abstract

The invention relates to a fault isolation rate distribution method, which mainly comprises the following steps of: step 1, constructing a diagnosis architecture of a to-be-distributed system, and determining to-be-distributed units; step 2, acquiring the failure rate, the maintenance time, the failure mode and the influence analysis and failure type of any unit to be distributed; step 3, determining a weighting factor of each distribution unit according to the failure rate, the maintenance time, the severity level in the failure mode and the failure mode type, wherein the weighting factor comprises a failure rate factor ki, a failure influence factor kFi, a maintenance time factor kMi and an in-machine failure diagnosis level influence coefficient kDi; and step 4, performing testability distribution according to the weighting factor and the fault isolation rate of the to-be-distributed system. The method pays attention to engineering practice, is high in operability, and gives consideration to specific conditions of different systems; Accuracy and precision of distribution results can be improved, designers of a system and equipment can be better guided and constrained to carry out corresponding testability design, and effective implementation of testability work is guaranteed.

Description

[0001] Field [0002] The invention belongs to the field of testability design and relates to a method for assigning a fault detection rate. Background technique [0003] The mathematical model of testability allocation is a mathematical equation indicating testability parameters, indicating the mathematical relationship between the part and the whole of the system, that is, the functional relationship between the system testability index and its constituent unit indexes. The basic requirement (objective function) of testability distribution is: under the constraints of use requirements and system characteristics, the index of each component is obtained from the system requirement index, and the system index obtained by the integrated index of each component unit is equal to Or greater than the original required index, and then build a mathematical model of fault isolation rate allocation. The traditional testability allocation method does not consider its own characteristics, and ...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/333G06F30/15
Inventor 谢娜
Owner XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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