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A 6T & 6TPPNN unit layout method based on minimum width constraint

A layout method and width technology, applied in the field of VLSI physical design automation, can solve problems such as the impact of circuit layout performance, achieve the effect of reducing fragment effects and improving circuit performance

Active Publication Date: 2019-04-26
北京华大九天科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, since 6TPPNN cells are double-height, and they can only be placed on half-rows, each 6TPPNN cell will have half-row fragmentation on the top and bottom sides, which has a significant impact on circuit layout performance

Method used

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  • A 6T & 6TPPNN unit layout method based on minimum width constraint
  • A 6T & 6TPPNN unit layout method based on minimum width constraint
  • A 6T & 6TPPNN unit layout method based on minimum width constraint

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Embodiment Construction

[0061] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0062] figure 2 It is a flow chart of the 6T&6TPPNN unit layout method based on the minimum width constraint according to the present invention, which will be referred to below figure 2 , the 6T&6TPPNN cell layout method based on the minimum width constraint of the present invention is described in detail.

[0063] The mathematical model of the 6T&6TPPNN unit layout method based on the minimum width constraint of the present invention is described as follows:

[0064] Firstly, given a C={c with n standard units 1 ,c 2 ,...,c n} and m lines E={e 1 ,e 2 ,...,e m}'s 6T&6TPPNN cell global layout. The layout area is a rectangular frame, where (0,0) and (W,H) ar...

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Abstract

The invention discloses a 6T & 6TPPNN unit layout method based on minimum width constraint. The 6T & 6TPPNN unit layout method comprises the following steps: considering unit alignment of Vdd / Vss track alignment constraint; Performing unit clustering based on minimum width constraint; Performing 6TPPNN unit conversion; performing cell movement based on the fragment effect; According to the methodprovided by the invention, on the premise of not increasing any chip design area, the line length increase caused on the basis of reducing all minimum width constraints can be reduced, meanwhile, thefragment effect is reduced, and the circuit performance is improved.

Description

technical field [0001] The invention relates to the technical field of VLSI physical design automation, in particular to a cell layout method. Background technique [0002] In traditional circuit design, standard cells with the same height are easier to design and optimize. Then, as the design complexity increases, the general 6T&6TPPNN unit structure with mixed height can achieve a better balance between area and winding linearity than single-height standard units. Specifically, smaller cell heights result in smaller area and lower power consumption, but at the expense of lower power drive. Conversely, a higher cell height can achieve greater power drive and better windability, but it also requires a larger area and higher power consumption. The circuit design of such mixed-height cells is more challenging due to the heterogeneity of the cell structure. Also, in this layout design, additional consideration needs to be given to aligning multiple row height cells to the co...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/392G06F2111/04
Inventor 周汉斌朱自然陈建利陈彬董森华
Owner 北京华大九天科技股份有限公司
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