Device and method for testing and calibrating microwave chip

Abstract

The invention relates to a device and a method for testing and calibrating a microwave chip. The device comprises a base, a printed circuit board, a connector, a wave absorbing material and a cover plate. An open cavity is formed in an upper end face of the base, the printed circuit board is placed in the cavity, and radio frequency connectors SMA are installed on both sides of the base; the circuit board is connected with the SMA connectors disposed on the both sides of the base; the wave absorbing material is adhered with the cover plate and is fixed to the upper surface of the base; and thecover plate is connected to the base by screws. According to the device provided by the invention, a calibration piece is designed and manufactured, a calibration end face is corrected from the bothends of a traditional radio frequency cable to the center of a through line, and errors in test data caused by a test fixture are eliminated; and the printed circuit board is adhered in the cavity ofthe base to ensure a large enough grounding area, the wave absorbing material is attached on the top of the printed circuit board to isolate the external electromagnetic radiation, thereby improving the anti-interference ability of the test and making the test data be more stable and reliable.

Description

technical field [0001] The invention relates to a device and method for testing and calibrating microwave chips. Background technique [0002] With the continuous advancement of microwave technology, the market size of microwave components has risen sharply. Microwave components have been widely used in various fields such as microwave communication systems, telemetry systems, navigation, biomedicine, electronic countermeasures, and artificial satellites. In the microwave system, those functions such as directional transmission, attenuation, isolation, filtering, phase control, waveform transformation, and impedance transformation domain allocation of microwave signals are collectively referred to as microwave components. Simply put, microwave components are electromagnetic components that work in the microwave frequency band. With the development of science and technology, microwave components are developing in the direction of miniaturization, chip type, high performance...

AI Technical Summary

Problems solved by technology

[0003] Taking microwave S-parameters as an example, the required test instrument is usually a vector network analyzer, and its input and output ports are usually coaxial connections, which cannot be directly connected to the chip

The S-parameter test of the chip is carried out on the test fixture after packaging. In addition to the performance index of the device itself, the test result also includes the error introduced by the packaging fixture, and the test result is inaccurate.

Images