IGBT (Insulated Gate Bipolar Translator) device with MOS (Metal Oxide Semiconductor) control hole path
A device and channel technology, applied in the field of power semiconductor devices, can solve the problems of large switching loss and reduced withstand voltage of devices, and achieve the effects of reducing saturated conduction voltage drop, compatible manufacturing process, and reducing turn-off loss
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Embodiment 1
[0033] An IGBT device with MOS controlled hole access, such as figure 2As shown, its cellular structure includes metal collector 7, P+ collector region 6, N-type buffer layer 5, N-drift region 4 and metal emitter 11 stacked sequentially from bottom to top; the N-drift region 4 The middle area of the top layer is provided with a P+ floating pbody area 8, and the two sides of the P+ floating pbody area 8 are respectively provided with a P+ base area 2, and the top layer of the P+ base area 2 is provided with an N+ emission area 1; The region 2 and the N+ emitter region 1 are in contact with the metal emitter 11; the P+ base region 2 and the N+ emitter region 1 are provided with an IGBT gate structure between the P+ floating pbody region 8, and the P+ floating pbody region 8 Not adjacent to the gate structure, the gate structure includes a gate electrode 9 and a gate dielectric layer 3, the gate dielectric layer 3 extends into the N-drift region 4 along the vertical direction ...
Embodiment 2
[0052] Such as image 3 As shown, the difference between this embodiment and Embodiment 1 is that the MOS control gate electrode 14 adopts a sharp-angled MOS control gate structure to further reduce Miller capacitance.
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