A Phase Subdivision Method Based on Wavelet Transform

A wavelet transform and phase technology, applied in the field of signal processing, can solve problems such as complex structure, excessive error, and subdivision multiple limit, and achieve the effects of strong anti-interference ability, lower sampling frequency, and higher frequency
CN109813233BActive Publication Date: 2021-02-19GUILIN UNIV OF ELECTRONIC TECH

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
GUILIN UNIV OF ELECTRONIC TECH
Publication Date
2021-02-19

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Abstract

The invention discloses a phase subdivision method based on wavelet transform, which includes converting the optical interference signal formed by a moving grating and a fixed grating into an electrical signal, and sampling the electrical signal to obtain sampling data; Perform wavelet transform to obtain the instantaneous frequency of each sampling point, fit each segment of sampling points and obtain the first frequency curve; determine the intermediate frequency between adjacent two points in the first frequency curve, and convert the Fit the intermediate frequency points to obtain the optimized frequency curve, and the sampling points between the two ends are distributed according to the fitted frequency curve; perform error detection on the optimized frequency curve to obtain the optimal frequency of the sampling point; calculate the elapsed time Δt from time t Afterwards, for the instantaneous frequency f(t+Δt) at the time point, suppose that the phase obtained after the time interval Δt is 2π / n, and count N while calculating the time interval Δt; calculate the motion of the moving grating according to the motion relationship distance.
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Description

technical field

[0001] The invention relates to the technical field of signal processing, in particular to a phase subdivision method based on wavelet transform. Background technique

[0002] With the rapid development of science and technology, various industries have higher and higher requirements for high-precision measurement technology, especially for industries involving nanotechnology, MEMS (micro-electromechanical system) technology and aerospace technology, the requirements for high-precision measurement technology It's even higher.

[0003] Due to the higher requirements for signal accuracy, if there is no way to improve the accuracy of the measuring instrument, it is necessary to further process and subdivide the measured signal. The general subdivision method can no longer meet the higher requirements due to the limitation of subdivision multiples, excessive error and complex structure. The current electronic subdivision methods are roughly divided into two typ...

Claims

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