A Numerical Integration Parameterized Ionospheric Chromatography Method

A technology of numerical integration and ionosphere, applied in the direction of analyzing materials, using radiation for material analysis, using wave/particle radiation for material analysis, etc., can solve problems such as insufficient accuracy, reduced calculation efficiency, model errors, etc., to improve tomography Solution accuracy, make up for theoretical defects, and accurately determine the effect
CN110031489BActive Publication Date: 2020-08-25CENT SOUTH UNIV
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Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Patents(China)
Current Assignee / Owner
CENT SOUTH UNIV
Publication Date
2020-08-25

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Abstract

The invention provides a numerical integration parameterized ionospheric tomographic method. An electron density value at each position in each voxel is not defined as uniform. The electron density value at any position in each voxel is associated with the electron density values of 8 voxel nodes of the voxel. Electron content is expressed as integration of an expression related to the electron density values of the voxel nodes. The electron density value at any position in the voxel is obtained by interpolating the electron density values of the 8 voxel nodes of the voxel. The electron density value at any position in the voxel can be obtained by obtaining the electron density values of the 8 voxel nodes of the voxel. A relatively accurate image with regular electron density distributionwithin a tested ionospheric range can be obtained. According to the method, the defect resulting from the fact that the electron density in the voxels is considered as uniform and unchanged in a conventional modeling process is overcome, the ionospheric tomographic model is refined, and modeling accuracy is improved. According to the method, the ionospheric tomographic model can be established relatively accurately. Compared with a conventional method, the method has the advantage that accuracy is improved by 20%.
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Description

technical field

[0001] The invention relates to the technical field of atmospheric detection and ionosphere monitoring, in particular to a numerical integration parameterized ionosphere tomography method. Background technique

[0002] The ionosphere is an important part of the Sun-Earth system, the ionized part of the Earth's upper atmosphere, which extends from an altitude of about 50 kilometers above the surface to thousands of kilometers. The earth's atmospheric molecules in this range interact with the high-speed particles in the earth's upper atmosphere atoms, molecules, and cosmic rays due to the radiation of ultraviolet rays and rays from the sun, so that the atmosphere is ionized and a large number of free electrons and ions are generated. The ionosphere is an important part of the near-Earth space environment in which human beings live. Fully understanding the ionosphere is an important basis for human beings to understand and use their own living environment. The ...

Claims

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