A Numerical Integration Parameterized Ionospheric Chromatography Method
A technology of numerical integration and ionosphere, applied in the direction of analyzing materials, using radiation for material analysis, using wave/particle radiation for material analysis, etc., can solve problems such as insufficient accuracy, reduced calculation efficiency, model errors, etc., to improve tomography Solution accuracy, make up for theoretical defects, and accurately determine the effect
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[0045] The embodiments of the present invention will be described in detail below with reference to the accompanying drawings, but the present invention can be implemented in various ways defined and covered by the claims.
[0046] A numerical integration parameterized ionospheric tomography method, in which, the total electron content TEC of all voxels passed by any ray is expressed as the integral of an expression related to the electron density value at the voxel node, specifically As shown in formula 1,
[0047] TEC = ∮ l N e d l (Formula 1)
[0048] In formula 1: l represents the ray path, d l is the corresponding oblique intercept at a single voxel along the ray path l, N e is the electron density value expression along the ray path l, N e Take the electron density values of the voxel nodes of all voxels that the ray l passes through as unknown parameters.
[0049] see figure 1 , in this embodiment, 5 equidistant points are taken on the oblique line segment c...
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