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A Numerical Integration Parameterized Ionospheric Chromatography Method

A technology of numerical integration and ionosphere, applied in the direction of analyzing materials, using radiation for material analysis, using wave/particle radiation for material analysis, etc., can solve problems such as insufficient accuracy, reduced calculation efficiency, model errors, etc., to improve tomography Solution accuracy, make up for theoretical defects, and accurately determine the effect

Active Publication Date: 2020-08-25
CENT SOUTH UNIV
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Problems solved by technology

In fact, the electron density varies greatly in space, especially in the vertical direction, and when the grid is large, it will cause model errors that cannot be ignored
Although fine grid division can alleviate the adverse effects of this unreasonable assumption to some extent, it will reduce computational efficiency and the constraints between voxels will also affect the results
Therefore, the accuracy of the current voxel-based ionospheric tomography model is insufficient, especially when the grid division is large or the spatial variation of electron density is severe.
Moreover, within the chromatographic time range (such as within 1 hour), it is impossible to have sufficient oblique path TEC penetration in each voxel. Therefore, voxel-based ionospheric chromatography generally has an ill-posed problem, and many voxels The electron density value cannot be determined. When the grid division is large or the electron density space changes drastically, the traditional voxel-based ionospheric tomography model cannot accurately express the spatial distribution of the electron density, resulting in low modeling accuracy. Limits the application of ionospheric chromatography to a certain extent

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  • A Numerical Integration Parameterized Ionospheric Chromatography Method
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  • A Numerical Integration Parameterized Ionospheric Chromatography Method

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Embodiment Construction

[0045] The embodiments of the present invention will be described in detail below with reference to the accompanying drawings, but the present invention can be implemented in various ways defined and covered by the claims.

[0046] A numerical integration parameterized ionospheric tomography method, in which, the total electron content TEC of all voxels passed by any ray is expressed as the integral of an expression related to the electron density value at the voxel node, specifically As shown in formula 1,

[0047] TEC = ∮ l N e d l (Formula 1)

[0048] In formula 1: l represents the ray path, d l is the corresponding oblique intercept at a single voxel along the ray path l, N e is the electron density value expression along the ray path l, N e Take the electron density values ​​of the voxel nodes of all voxels that the ray l passes through as unknown parameters.

[0049] see figure 1 , in this embodiment, 5 equidistant points are taken on the oblique line segment c...

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Abstract

The invention provides a numerical integration parameterized ionospheric tomographic method. An electron density value at each position in each voxel is not defined as uniform. The electron density value at any position in each voxel is associated with the electron density values of 8 voxel nodes of the voxel. Electron content is expressed as integration of an expression related to the electron density values of the voxel nodes. The electron density value at any position in the voxel is obtained by interpolating the electron density values of the 8 voxel nodes of the voxel. The electron density value at any position in the voxel can be obtained by obtaining the electron density values of the 8 voxel nodes of the voxel. A relatively accurate image with regular electron density distributionwithin a tested ionospheric range can be obtained. According to the method, the defect resulting from the fact that the electron density in the voxels is considered as uniform and unchanged in a conventional modeling process is overcome, the ionospheric tomographic model is refined, and modeling accuracy is improved. According to the method, the ionospheric tomographic model can be established relatively accurately. Compared with a conventional method, the method has the advantage that accuracy is improved by 20%.

Description

technical field [0001] The invention relates to the technical field of atmospheric detection and ionosphere monitoring, in particular to a numerical integration parameterized ionosphere tomography method. Background technique [0002] The ionosphere is an important part of the Sun-Earth system, the ionized part of the Earth's upper atmosphere, which extends from an altitude of about 50 kilometers above the surface to thousands of kilometers. The earth's atmospheric molecules in this range interact with the high-speed particles in the earth's upper atmosphere atoms, molecules, and cosmic rays due to the radiation of ultraviolet rays and rays from the sun, so that the atmosphere is ionized and a large number of free electrons and ions are generated. The ionosphere is an important part of the near-Earth space environment in which human beings live. Fully understanding the ionosphere is an important basis for human beings to understand and use their own living environment. The ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/044
CPCG01N23/04
Inventor 陈必焰
Owner CENT SOUTH UNIV
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