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60 results about "Electron density distribution" patented technology

Electron-density distribution. The electron-density distribution is the three-dimensional realspace arrangement of the electrons in the material. Because electrons are quantum mechanically delocalized, each electron occupies a 'fuzzy' region of space (electron cloud).

Ionized layer chromatography technology and ionized layer delay correction method based on multi-scale subdivision

The invention discloses an ionized layer chromatography technology and an ionized layer delay correction method based on multi-scale subdivision. A three-dimensional space of an area ionized layer is subdivided according to different 'pixel' scales to obtain a plurality of different single-scale ionized layer chromatography models, unknown variables of the models are uniformly solved and weighted according to different weight factors to obtain solutions of a multi-scale chromatography model, and electron density distribution of the area ionized layer is reconstructed to obtain delay of the area ionized layer. The space activity rule of the reconstructed ionized layer is high in fitting degree, high in timeliness and convenient to use. According to the obtained area ionized layer, the delay quantity solution result is high in accuracy, so that the application range of CORS measurement results is enlarged. It is proved through a lot of project case application result analysis that the electron density distribution of the area ionized layer reconstructed through the method is more smooth and reasonable compared with a traditional single-scale ionized layer chromatography model, and ionized layer delay correction accuracy is improved by 30% on average.
Owner:SOUTHEAST UNIV

High-temperature flue gas thermal electron emission type particulate matter charge device

The invention discloses a particulate charged device with high temperature flue gas thermal electron-emission type, which consists of an emission electrode bar (1) and a conductive cylinder body (2); the composite functional material of rare-earth tungsten is adopted by the emission electrode bar as a thermal electron-emission cathode; the conductive cylinder body is grounded as a thermal electron-emission anode; an insulated sleeve (3) is arranged at the middle part of the conductive cylinder body; a conductive suspended bar (4) penetrates the insulated sleeve and the emission electrode bar is suspended into the conductive cylinder body. By adopting the composite functional material of rare-earth tungsten to produce thermal electronic-emission electrode, the performance of high-temperature resistance of the device of the invention is improved, thus causing the working temperature of device to be capable of reaching 1,200 DEG C; since the charged area adopts a ring structure, the characteristics of thermal electron-emission can be embodied fully, thus improving the uniformity of the density of the electron distribution; since the thermal electron emission technology is adopted, the current density in the charged area is 3 to 4 orders of magnitude higher than that of traditional charged technology with corona discharging type.
Owner:CHANGSHU NANJING NORMAL UNIV DEV RES INST

Solid state image wavelength converter

A method for encoding information that is encoded in spatial variations of the intensity of light characterized by a first wavelength in light characterized by a second wavelength, the method comprising: transmitting the first wavelength light through a photo-conducting material in which electron-hole pairs are generated by absorbing photons from the first wavelength light to generate a first density distribution of electrons homologous with the spatial variations in intensity of the first wavelength light; trapping electrons from the first electron density distributions in a trapping region to generate an electric field homologous with the density distribution in a material that modulates a characteristic of light that passes therethrough responsive to an electric field therein; transmitting a pulse of light having sufficient energy to generate electron-hole pairs in the photo-conducting material through the modulating material and thereafter through the photo-conducting layer to generate a second additional electron density homologous with the first electron density distribution; trapping electrons from the second electron density distribution in the trapping region; and transmitting the second wavelength light through the modulating material thereby modulating the second wavelength light in response to the electric field and encoding it with the information.
Owner:MICROSOFT INT HLDG BV

Discharge plasma electron density measuring device and method based on two-quadrant detector

InactiveCN103068136AOvercoming structural complexityOvercome the disadvantage of expensive equipmentPlasma techniqueMeasurement devicePlasma electron
The invention discloses a discharge plasma electron density measuring device and a method. The device comprises a detecting light source, a two-quadrant detector and a signal processor. The detecting light source and the two-quadrant detector are respectively placed on two rotating translation stages and respectively arranged at two ends of a discharge device, and a laser of the detecting light source aims at the center of the two-quadrant detector. The fact that the detecting light source and the two-quadrant detector move the same distance in the same dimension is repeated for times, and the response amplitude ratio of two photosensitive surfaces of the two-quadrant detector at different positions is recorded when power is discharged. Then, the discharge plasma electron density distribution on the dimension is calculated according to the response amplitude ratio of the two photosensitive surfaces by the signal processor. The discharge plasma electron density measuring device and the method overcome the defects of the complex system structure and expansive equipment of a traditional measuring device, and meanwhile can effectively improve measuring precision, do not interfere with discharge plasmas, and obtain the space distribution of the discharge plasma electron density.
Owner:HUAZHONG UNIV OF SCI & TECH

Oxide cathode

The invention provides an oxide cathode, which particularly comprises the following steps: preparing a cathode-based metal, and reserving a geometric margin on the peripheral surface of an emission layer; pouring nickel powder onto the cathode-based metal by a molding method and putting the entire cathode-based metal together with a mold into a hydrogen furnace for sintering into a nickel sponge layer, reserving a certain geometric margin on the prepared nickel sponge layer, filling the nickel sponge layer with alkali earth metal carbonate, mechanically compacting an emission surface of a cathode emission layer, and removing the residual geometric margin; carrying out pre-decomposition on the oxide cathode before pipe filling; and clamping the oxide cathode on a chuck of a lathe, turning the emission layer and the peripheral surface, removing the residual geometric margin, and then wiping away all particles attached to the cathode surface. The cathode surface provided by the invention becomes smooth, regular, bright and clean; a hot particle emission angle is reduced; deformation of emission electron density distribution is limited; the particle bombardment resistance of the cathode is improved; the sparking probability of the cathode emission surface is reduced; the work stability of the cathode is improved; and the lifetime of the cathode is prolonged.
Owner:甘肃虹光电子有限责任公司

Method for evaluating crystal electron density distribution model and application thereof

The invention provides a method for evaluating a crystal electron density distribution model and application thereof. The evaluation method comprises the following steps: S1, calculating a structure amplitude value of an accurate electron density distribution model of a to-be-detected crystal subjected to first perturbation, and enabling the sum of accurate electron density distribution models of the various atoms in the to-be-detected crystal in a structure cell after perturbation to be the same as the extranuclear electron number of corresponding atoms by virtue of the first perturbation; S2, calculating a structure amplitude value of a current electron density distribution model of the to-be-detected crystal subjected to perturbation, and enabling a low-density area in the current electron density distribution model to be changed by virtue of perturbation; and S3, comparing the structure amplitude value in S2 with the structure amplitude value in S1 so as to evaluate the current electron density distribution model. The evaluation method disclosed by the invention can be used for crystal structure analysis. The traditional evaluation method is failed under the low data resolution condition, while the evaluation method provided by the invention is still effective.
Owner:THE NAT CENT FOR NANOSCI & TECH NCNST OF CHINA

Ionized layer tomography method for improving iteration initial value precision

The invention relates to an ionosphere tomography method for improving the precision of an iteration initial value, computer equipment and a computer readable storage medium. The method comprises steps of segmenting an ionosphere region into a plurality of grids, and determining the coordinate and the electron density initial value of each grid; a plurality of vertical measuring instruments being arranged below the ionosphere area at intervals, and the vertical measuring instruments being combined with satellite-borne full-polarization SAR data to determine the vertical electron density of a plurality of different points; updating an electron density initial value of the corresponding grid; acquiring a plurality of rays of different paths by using a GPS (Global Positioning System) and inverting a TEC value corresponding to each ray; calculating the projection length of each ray in each grid; and performing tomography iteration inversion based on a multiplication algebraic reconstruction method, and obtaining the electron density distribution of the ionized layer region after multiple iterations. According to the method, ionosphere IRI empirical model data is corrected by using the vertical measuring instrument and the satellite-borne full-polarization SAR data, so authenticity of an iteration initial value is improved, and ionosphere tomography precision can be improved.
Owner:CHINA ACADEMY OF SPACE TECHNOLOGY
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