A substrate transfer mechanism, photolithography machine and substrate transfer method

A substrate and adapter plate technology, applied in microlithography exposure equipment, optics, optomechanical equipment, etc., can solve the problems of poor control of the lift of the ejector pin, redundant thickness of the substrate carrier, and high measurement and detection requirements. To achieve the effect of shortening handover time, compact structure, handover efficiency and safety

A substrate and adapter plate technology, applied in microlithography exposure equipment, optics, optomechanical equipment, etc., can solve the problems of poor control of the lift of the ejector pin, redundant thickness of the substrate carrier, and high measurement and detection requirements. To achieve the effect of shortening handover time, compact structure, handover efficiency and safety

CN110032044BActive Publication Date: 2021-03-19SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A substrate transfer mechanism, photolithography machine and substrate transfer method
  • A substrate transfer mechanism, photolithography machine and substrate transfer method
  • A substrate transfer mechanism, photolithography machine and substrate transfer method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] The specific implementation manner of the present invention will be described in more detail below with reference to schematic diagrams. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in a very simplified form and use imprecise scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0041] After studying the following three types of substrate transfer devices that can rotate at a large angle, the inventors found that:

[0042] (1) Grooves are directly made on the base carrier, but the vertical lifting stroke during the handover process of the substrate transfer manipulator is limited, and if the depth of the groove on the base carrier is increased, the substrate carrier will be redundant in the vertical direction. excess thickness;

[0043](2) Add the ejector pin detachment means. After th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Disclosed are a substrate transfer mechanism, a photoetching machine and a substrate transfer method, wherein the substrate transfer mechanism comprises a base (1), a rotation driving unit (2), a lifting driving unit (4) and a substrate carrier (3). The rotation driving unit (2) is arranged on the base (1), the substrate carrier (3) is arranged on the rotation driving unit (2), the lifting driving unit (4) is located below the substrate carrier (3), and the lifting driving unit (4) rotates along with the substrate carrier (3). The lifting driving unit (4) comprises a lifting driving motor (45a), ejection pins (43a, 43b, 43c) and a lifting guiding module (44a), the lifting driving motor (45a) driving the ejection pins (43a, 43b, 43c) to pass through the substrate carrier (3) to perform lifting, and the lifting guiding module (44a) directing a lifting direction of the ejection pins (43a, 43b, 43c). The substrate transfer mechanism can realize a large-angle rotation of a substrate, and has high transfer precision and efficiency, high reliability, a compact structure, a small spatial occupied size, and almost has no transfer lifting redundant stroke and transfer impact risk, and has high transfer security.

Description

technical field [0001] The invention relates to the technical field of integrated circuit manufacturing, in particular to a substrate transfer mechanism, a photolithography machine and a substrate transfer method. Background technique [0002] After experiencing the development stages of small-scale integration (SSI), medium-scale integration (MSI) and large-scale integration (LSI), integrated circuit manufacturing technology has now entered the stage of very large-scale integration (VLSI) and ultra-large-scale integration (ULSI). , The scale of integration has grown from a few transistors on a single substrate to tens of millions or even hundreds of millions of transistors on one substrate. The characteristic line width that marks the level of integrated circuit technology has also developed from tens of microns for small-scale integrated circuits to today's ultra-deep submicron (VDSM) level, and the diameter of the substrate has gradually changed from 2 inches, 3 inches, 4...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
19 Mar 2021
Publication
CN110032044B
IPC
G03F7/20
CPC
G03F7/70716; G03F7/70733; G03F7/20; H01L21/683
Inventors
吴文娟