Defect detection method based on transmission structured light
A defect detection and structured light technology, which is applied in measuring devices, material analysis through optical means, instruments, etc., can solve problems that are not conducive to workers' health and corporate interests
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[0073] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0074] The present invention proposes a defect detection method based on transmitted structured light, which is used to detect surface defects of objects with high transmittance, and can realize defect detection and identification in a non-contact, simple and fast manner. The detection system designed by this method can directly Detect defect information on the measured object, which can be applied to large-sized and large-curvature measured objects. Figure 1(a) and Figure 1(b) show the structure diagram of the detection system, and Figure 1(c) shows the optical path diagram, the detection system includes structured light illumination module, image acquisition module, system control and data processing module. The structured light lighting module is composed of an LCD liquid crystal display. The display generates a ...
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