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High breakdown voltage Schottky diode and method of making the same

A technology of Schottky diode and high breakdown voltage, which is applied in the manufacture of circuits, electrical components, semiconductors/solid-state devices, etc., can solve the problem of insufficient breakdown voltage, improve the distribution of edge electric field intensity, and improve the distribution of Schottky electrodes. Uniform distribution of fringe electric field intensity and improvement of breakdown voltage

Active Publication Date: 2020-11-03
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the method of simply adding field plates can only optimize the electric field intensity distribution of the device at the edge of the Schottky contact on the two-dimensional structure, which limits the distribution of the electric field intensity and makes the breakdown voltage still not high enough. thus limiting the Ga 2 o 3 Application of Schottky Diodes in High Voltage and High Power Devices

Method used

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  • High breakdown voltage Schottky diode and method of making the same
  • High breakdown voltage Schottky diode and method of making the same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0045] Embodiment 1, making low-doped n-type Ga 2 o 3 High breakdown voltage Schottky diode with ramp groove depth of 400nm and slope angle of 40°.

[0046] Step 1, for highly doped n-type Ga 2 o 3 Substrates undergo standard cleaning such as figure 2 (a).

[0047] 1a) Highly doped n-type Ga 2 o 3 The substrate is cleaned in an organic cleaning solution at 80°C for 20 minutes;

[0048] 1b) Cleaning the organically cleaned substrate with flowing deionized water for 40 seconds;

[0049] 1c) Put the cleaned substrate into HF:H 2 Corrosion in O=1:1 solution for 60s;

[0050] 1d) The etched Ga 2 o 3 The substrate was rinsed with flowing deionized water for 60 s, and dried with high-purity nitrogen gas.

[0051] Step 2, epitaxial growth of low-doped n-type Ga 2 o 3 film, such as figure 2 (b).

[0052] Put the cleaned substrate into the MOCVD reaction chamber, respectively with TMGa and high-purity O 2 For Ga source and O source, set the reaction chamber temperatur...

Embodiment 2

[0075] Example 2, making low-doped n-type Ga with an etching depth of 500 nm and an inclination angle of 50° 2 o 3 Ramp groove high breakdown voltage Schottky diodes.

[0076] Step 1, for highly doped n-type Ga 2 o 3 Standard cleaning of the substrate, such as figure 2 (a).

[0077] The specific implementation of this step is the same as step 1 of Embodiment 1.

[0078] Step 2, epitaxial growth of low-doped n-type Ga 2 o 3 film, such as figure 2 (b).

[0079] Put the cleaned substrate into the MOCVD reaction chamber, respectively with TMGa and high-purity O 2 For Ga source and O source, set the reaction chamber temperature to 800°C, growth pressure to 120Pa, TMGa flow rate to 10 sccm, O 2 The flow rate is 300sccm, and the low-doped n-type Ga with a thickness of 700nm is epitaxially grown on the substrate 2 o 3 film.

[0080] Step 3, making ohmic contact electrodes, such as figure 2 (c).

[0081] 3.1) Highly doped n-type Ga after epitaxial growth 2 o 3 Evapo...

Embodiment A

[0101] Embodiment A, making etch depth is 600nm, the inclination angle is 60 ° of low-doped n-type Ga 2 o 3 Ramp groove high breakdown voltage Schottky diodes.

[0102] A1, for highly doped n-type Ga 2 o 3 Standard cleaning of the substrate, such as figure 2 (a).

[0103] The specific implementation of this step is the same as step 1 of Embodiment 1.

[0104] A2, Epitaxial growth of low-doped n-type Ga 2 o 3 film, such as figure 2 (b).

[0105] Put the cleaned substrate into the MOCVD reaction chamber, respectively with TMGa and high-purity O 2 For Ga source and O source, set the reaction chamber temperature to 850°C, growth pressure to 120Pa, TMGa flow rate to 10 sccm, O 2 The flow rate is 300sccm, and the low-doped n-type Ga with a thickness of 800nm ​​is epitaxially grown on the substrate 2 o 3 film.

[0106] A3, making ohmic contact electrodes, such as figure 2 (c).

[0107] Highly doped n-type Ga after epitaxial growth 2 o 3 Evaporate metal Ti / Au on th...

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Abstract

The invention discloses a Schottky diode with a high breakdown voltage, and mainly solves the problems that an existing Schottky diode device is too low in breakdown voltage and cannot be widely applied to high-voltage and high-power devices. The Schottky diode comprises an ohmic contact metal Au layer, an ohmic contact metal Ti layer, a highly-doped n-type Ga2O3 substrate and a low-doped n-type Ga2O3 film. The low-doped n-type Ga2O3 film is provided with a slope groove table. A metal ring is arranged on the side wall of the slope groove table. A Schottky electrode Ni layer and a Schottky electrode Au layer are arranged on the table board of the slope groove table. Insulating media are arranged on the two sides of the Schottky electrode Ni layer and the two sides of the Schottky electrodeAu layer. Schottky field plates are arranged on the Schottky electrode Ni layer, the Schottky electrode Au layer and the insulating media. According to the invention, the sharp and concentrated distribution of electric field intensity borne by the edge of the Schottky junction along with voltage increase during reverse turn-off is avoided, while the breakdown voltage is improved. The Schottky diode can be used as a power device and a high-voltage switch device.

Description

technical field [0001] The invention belongs to the technical field of microelectronic devices, in particular to a Schottky diode, which can be used as a power device and a high-voltage switch device. Background technique [0002] With the application of semiconductor devices in more and more technical fields, traditional silicon-based and other narrow-bandgap semiconductor diodes have encountered many challenges. Among them, the breakdown voltage is difficult to meet the growing demand, which has become one of the key factors affecting the further improvement of device performance. one. Gallium oxide (Ga 2 o 3 ) Compared with the third-generation semiconductor materials represented by SiC and GaN, it has a wider band gap, and the breakdown field strength is equivalent to more than 20 times that of Si, and more than 2 times that of SiC and GaN. In theory, When manufacturing diode devices with the same withstand voltage, the on-resistance of the device can be reduced to 1 / ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/40H01L29/872H01L21/34
CPCH01L29/402H01L29/66969H01L29/872
Inventor 冯倩张涛张进成周弘张春福胡壮壮封兆青蔡云匆
Owner XIDIAN UNIV