Fourier laminated microscope pupil recovery method based on neural network

A technology of neural network and restoration method, which is applied in the field of microscope image reconstruction based on Fourier stack imaging technology, can solve the problems of low reconstruction accuracy and poor versatility of reconstruction models, and achieve good reconstruction results, good universality, and suppression The effect of optical aberrations
CN110378981AActive Publication Date: 2019-10-25CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Publication Date
2019-10-25

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Abstract

The invention discloses a Fourier laminated microscope pupil recovery method based on a neural network in the field of computer imaging. The problem that the reconstruction precision of the existingFourier laminated imaging model is low under the influence of optical phase difference is solved. A neural network model is established based on a TensorFlow deep learning framework in combination with a forward imaging mode of an FPM system. The problem that the universality of a reconstruction model based on a deep convolutional neural network is poor is solved; a recovery process for a pupil function of the system is introduced, so that the influence of optical aberration in the system on a reconstruction result can be better suppressed, and a better result is obtained. According to the invention, the frequency spectrum and the pupil function of the sample are set as a trainable two-dimensional network layer in the network; complex amplitude information and a pupil function of a sampleare obtained at the same time by minimizing a loss function in the training process. The method has good universality and can still obtain a reconstruction result better than that of a traditional algorithm under the condition that aberration exists in the system.
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Description

technical field

[0001] The invention relates to the field of computational imaging, in particular to a microscope image reconstruction method based on Fourier stack imaging technology. Background technique

[0002] Fourier stack imaging microscopy (FPM) is a newly developed imaging method designed to circumvent the limitation of spatial bandwidth product (SBP) and obtain complex images with wide field of view and high resolution. Since 2013, Fourier stack imaging technology has been applied in optical microscopy, biomedicine, life sciences and other fields to obtain microscopic images with large field of view and high resolution. However, in FPM imaging systems, pupil aberrations of the used optical elements and incoherent light imaging significantly degrade the quality of the reconstruction results. Contents of the invention

[0003] In order to solve the problems of low reconstruction accuracy caused by the existing Fourier stack imaging model under the influence of opt...

Claims

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