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Inspection system and method for semiconductor integrated circuit device

A technology of integrated circuits and inspection systems, applied in the direction of circuits, semiconductor/solid-state device testing/measurement, electrical components, etc., to achieve the effects of production improvement, production process improvement, and production quality improvement

Active Publication Date: 2021-12-17
SHENZHEN CITY GCAI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide an inspection system and method for semiconductor integrated circuit devices to solve the problems raised in the prior art

Method used

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  • Inspection system and method for semiconductor integrated circuit device
  • Inspection system and method for semiconductor integrated circuit device
  • Inspection system and method for semiconductor integrated circuit device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0044] Example: such as Figure 1-3 As shown, the present invention provides a technical solution, an inspection system for semiconductor integrated circuit devices, the inspection system includes an inspection module, a control module, an alarm module and a cloud platform;

[0045]The output terminal of the inspection module is electrically connected to the input terminal of the control module, and the output terminal of the control module is electrically connected to the input terminal of the alarm module and the cloud platform;

[0046] Inspection module: used to check whether the welding pins of semiconductor integrated circuits have virtual welding;

[0047] Control module: used to intelligently control the entire system, and also used to visually display the inspection results;

[0048] Alarm module: used to alarm when there is a false soldering phenomenon in the inspection of the semiconductor integrated circuit;

[0049] Cloud platform: used to store and analyze insp...

Embodiment 1

[0088] Embodiment 1: Use the input keyboard to input the voltage value of 4.8V, the resistance value of 22Ω and the resistance value of the display diode into the PLC controller, according to Ohm's law:

[0089]

[0090] Calculate the expected current value I in the inspection module circuit 1 =0.5A;

[0091] Utilize the current transformer to check the real-time current I2=0A of the module circuit;

[0092] I 1 ≠ I 2 , indicating that the soldering of electronic components of semiconductor integrated circuits has a virtual soldering phenomenon.

Embodiment 2

[0093] Embodiment 2: Use the input keyboard to input the voltage value of 4.8V, the resistance value of 22Ω and the resistance value of the display diode into the PLC controller by using the input keyboard. According to Ohm's law:

[0094]

[0095] Calculate the expected current value I in the inspection module circuit 1 =0.5A;

[0096] Use the current transformer pair to check the real-time current I of the module circuit 2 =0.5A;

[0097] I 1 = I 2 , indicating that the soldering of electronic components of semiconductor integrated circuits is in a normal state.

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Abstract

The invention discloses an inspection system and method for a semiconductor integrated circuit device. The inspection system includes an inspection module, a control module, an alarm module and a cloud platform. The cloud platform is used for storing and analyzing inspection data. The invention is scientific and reasonable, and can be used Safe and convenient, use the database in the cloud platform to store the detection results of each single electronic component pin, and use the data analysis sub-module, data extraction sub-module and data combination sub-module to process the stored data, which can effectively Extracting and judging the checked pin data can effectively understand which electronic components are prone to failure during the production process of semiconductor integrated circuits, which is convenient for improving the production process of semiconductor integrated circuits in the later stage, and can effectively Improving the production quality of semiconductor integrated circuits can continuously improve the production of semiconductor integrated circuits.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuits, in particular to an inspection system and method for semiconductor integrated circuit devices. Background technique [0002] Semiconductor integrated circuits are active components such as transistors and diodes and passive components such as resistors and capacitors, interconnected according to a certain circuit, and integrated on a semiconductor single chip to complete specific circuit or system functions. [0003] However, after the semiconductor integrated circuit is manufactured, if the electronic components have a false soldering phenomenon, the semiconductor integrated circuit will be unusable. The traditional method does not store and process the inspected data when inspecting the semiconductor integrated circuit, making it impossible Summarizing defects in the production process based on previous inspection records cannot improve and improve the production proce...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66
CPCH01L22/14
Inventor 郝建华李会斌李子考
Owner SHENZHEN CITY GCAI ELECTRONICS
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