Liquid sample cavity for characterization by transmission electron microscope and preparation method thereof

A technology of transmission electron microscopy and liquid samples, which is applied in the fields of material analysis using radiation, material analysis using wave/particle radiation, and measuring devices, etc. It can solve the problems of high technical level requirements, small observation window size, and small number of observation windows, etc. , to achieve the effect of low technical level, low material cost and low cost

Active Publication Date: 2019-12-31
SOUTHEAST UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Technical problem: The purpose of the present invention is to provide a liquid sample chamber for transmission electron microscope characterization and its preparation method, to provide a low-cost solution for characterizing the nucleation, growth, self-assembly, etc. of nanomaterials in a liquid environment, Solve the problems of complex process and high technical level in the production of liquid sample chambers in the market, and at the same time solve the problems of small observation window size and small number of observation windows of mainstream liquid sample chamber products

Method used

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  • Liquid sample cavity for characterization by transmission electron microscope and preparation method thereof
  • Liquid sample cavity for characterization by transmission electron microscope and preparation method thereof

Examples

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Embodiment 1

[0029] A preparation method for a liquid sample chamber characterized by transmission electron microscopy, the method comprising the following steps:

[0030] 1) Take two transmission electron microscopes with a diameter of 3mm to characterize the lead-tin-indium alloy grid skeleton with a melting point of 50°C. One surface of a lead-tin-indium alloy grid skeleton is covered with a 10nm thick square film to obtain a metal grid;

[0031] 2) Place one of the lead-tin-indium alloy grids on a flat heating platform with an organic film underneath, drop the liquid sample to be characterized from above the lead-tin-indium alloy grid, and then place an organic film on its surface cover another lead-tin-indium alloy carrier grid in a way;

[0032] 3) Heat the two lead-tin-indium alloy grids covered together until the lead-tin-indium alloy framework of the metal grid begins to soften, and then apply pressure perpendicular to the direction of the metal grid until the lead-tin-indium all...

Embodiment 2

[0036] A preparation method for a liquid sample chamber characterized by transmission electron microscopy, the method comprising the following steps:

[0037] 1) Take two lead-tin alloy grid skeletons with a melting point of 70°C for TEM characterization with a diameter of 3 mm. One surface of the lead-tin alloy grid skeleton is covered with a 30nm thick Fanghua film to obtain a metal grid;

[0038] 2) Place one of the lead-tin alloy grids on a flat heating table with the organic film on the bottom, drop the liquid sample to be characterized from above the lead-tin alloy grid, and then place the organic film on its surface. Overlay another pewter grid;

[0039] 3) Heat the two lead-tin alloy grids covered together until the lead-tin alloy skeleton of the metal grid begins to soften, and then apply pressure perpendicular to the direction of the metal grid until the lead-tin skeletons are fused with each other. A sealed liquid sample window is formed in the cross grid of the l...

Embodiment 3

[0043] A preparation method for a liquid sample chamber characterized by transmission electron microscopy, the method comprising the following steps:

[0044]1) Take two bismuth-tin alloy grid skeletons with a diameter of 3 mm for characterization with a melting point of 80 ° C, the mesh number of which is 800 mesh, the internal mesh is square holes, and the thickness of the skeleton is 18 μm. One surface of the bismuth-tin alloy grid skeleton is covered with a 10nm thick collodion film to obtain a metal grid;

[0045] 2) Place one of the bismuth-tin alloy grids on a flat heating table with the organic film on the bottom, drop the liquid sample to be characterized from above the bismuth-tin alloy grid, and then place the organic film on its surface Cover another bismuth-tin alloy grid;

[0046] 3) Heat the two bismuth-tin alloy grids covered together until the bismuth-tin alloy skeleton of the metal grid begins to soften, and then apply pressure perpendicular to the direction...

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Abstract

The invention discloses a liquid sample cavity for characterization by a transmission electron microscope and a preparation method thereof. The method comprises the following steps of: 1) taking two low-melting-point metal grid frameworks for characterization by the transmission electron microscope, and covering one surface of each low-melting-point metal grid framework with an organic film to obtain a metal grid, 2) placing one metal grid in a manner in which the organic film is arranged at the lower part, dropwise adding a to-be-characterized liquid sample from the upper part of the metal grid, and then covering the surface of the metal grid with the other metal grid in a manner in which the organic film is arranged at the upper part, 3) heating the two metal grids until the grid framework starts to soften, performing extruding by an external force until the grid frameworks are fused with each other, and forming a sealed liquid sample window in the crossed grid of the two metal grids, and (4) the grid framework is hardened after the two metal grids are cooled to a room temperature, and carrying out leakage detection to obtain a liquid sample cavity with the plurality of sample windows. The method is based on the low-melting-point metal grids, is simple and easy to prepare, low in cost, high in repeatability and simple to use, and can be used for characterizing a liquid environment by the transmission electron microscope.

Description

Technical field: [0001] The invention relates to a liquid sample cavity used for transmission electron microscope characterization and a preparation method thereof, belonging to the field of transmission electron microscope characterization testing. Background technique: [0002] In recent years, nanomaterials have been widely used in industries such as medical equipment, electronic equipment and coatings. Due to the unique properties of nanomaterials, characterizing the microstructure and physicochemical properties of nanomaterials has become an important basis for promoting the development of functional devices. Thanks to its ultra-high resolution, transmission electron microscopy has become one of the most important technical methods for testing and characterizing the morphology, structure, composition and physical properties of nanomaterials. [0003] Because liquid samples have a large saturated vapor pressure, they cannot exist stably in the high vacuum environment of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20025G01N23/04
CPCG01N23/04G01N23/20025
Inventor 贺龙兵杨宇峰宗思洁
Owner SOUTHEAST UNIV
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