A silicon-based integrated microwave frequency measuring instrument

A technology of microwave frequency measurement and frequency, which is applied in the direction of frequency measurement devices, etc., to achieve the effects of improving signal resolution, lightening integrated chips, and powerful preprocessing capabilities

Active Publication Date: 2020-11-24
HUAZHONG UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the defects of the prior art, the object of the present invention is to provide a silicon-based integrated microwave frequency measuring instrument, which aims to solve the problem that the existing microwave instantaneous frequency measurement can only measure a single frequency

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  • A silicon-based integrated microwave frequency measuring instrument
  • A silicon-based integrated microwave frequency measuring instrument
  • A silicon-based integrated microwave frequency measuring instrument

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Embodiment Construction

[0026] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute conflicts with each other.

[0027] Such as figure 1 As shown, the silicon-based integrated microwave frequency measuring instrument of the embodiment of the present invention includes: a dual-parallel Mach-Zehnder modulator 1, a frequency classification unit 2, a first thermally tuned microring 21, a first photodetector 22, and a frequency selection unit 3. The second thermally tunable microring 31, the third thermally tun...

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Abstract

The invention discloses a silicon-based integrated microwave frequency measuring instrument, which comprises an electro-optical intensity modulator, a frequency classification unit, a frequency selection unit, an instantaneous frequency measurement unit and a Y branch; the electro-optical intensity modulator is used for loading a microwave signal to be measured to an optical carrier to form an optical carrier microwave signal; the Y branch divides the optical carrier microwave signal into two paths with equal intensity, the two paths of the optical carrier microwave signal are respectively sent to the frequency classification unit and the frequency selection unit, the frequency classification unit is used for judging the frequency component and the frequency type of the optical carrier microwave signal, and the frequency selection unit is used for shaping the frequency spectrum and sending the selected frequency band to the instantaneous frequency measurement unit; the instantaneous frequency measurement unit provides two independent linear frequency responses, maps the frequency of the optical carrier microwave signal to the power through the two linear frequency responses, and determines the frequency of the microwave signal to be measured by measuring the power. Therefore, different types of unknown signals can be identified during instantaneous measurement, and the capability of distinguishing complex signals in a complex environment is greatly improved.

Description

technical field [0001] The invention belongs to the technical field of microwave frequency measurement, and more specifically relates to a silicon-based integrated microwave frequency measuring instrument. Background technique [0002] Compared with traditional electronic devices, microwave photonics has the characteristics of low loss, large bandwidth, and anti-electromagnetic interference, so it is widely used in the microwave field. Microwave frequency measurement based on microwave photonics has received attention in both civilian and military fields. [0003] Some existing schemes are based on the instantaneous frequency measurement system composed of integrated optical discriminators. In this method, microwave power of different frequencies is mapped to the response of the filter through an optical filter, and the corresponding microwave frequency can be deduced through the amplitude comparison function. This method can only distinguish a single frequency at the same...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/02
CPCG01R23/02
Inventor 董建绩赵雨赫张新亮
Owner HUAZHONG UNIV OF SCI & TECH
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