Testing device and testing method for Internet of Things semiconductor equipment
A test device, semiconductor technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of long time consumption and low detection efficiency, achieve accurate detection results and improve detection efficiency
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[0042] see figure 1 , a test device for semiconductor equipment of the Internet of Things, comprising a test host 2, a control panel is arranged on the test host 2, a base 1 is fixedly connected to the lower end of the test host 2, and a main control board 3 is installed inside the test host 2, The upper side of the base 1 is provided with a pair of splints 12 parallel to each other, and the splints 12 are located on one side of the test host 2. Please refer to figure 2 The upper end of the base 1 is dug with a main chute 101, the lower end of the splint 12 is slidably connected to the inside of the main chute 101, the upper end of the base 1 is fixedly connected with a backing plate 11, and the backing plate 11 is located on the upper side of the main chute 101, A rectangular hole is drilled on the splint 12, the backing plate 11 is located inside the rectangular hole, and the splint 12 is slidably connected to the outside of the backing plate 11 through the rectangular hole...
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