Fault Diagnosis Model of Analog Circuit Based on Algebraic Method

Abstract

The invention discloses an analog circuit fault diagnosis based on an algebraic method. The method integrates fault detection, fault location and fault parameter identification into one model for integrated processing, and adopts topology correlation algorithm to select effective test points to improve Fault coverage, convenient implementation, less online calculation time, can effectively overcome the influence of noise on fault diagnosis results, and meet the actual needs of engineering applications, and the particularity of this method solves the problem of continuous analog circuit device parameters and difficult parameter identification. At the same time, the method can still realize fault diagnosis under certain under-sampling conditions. Finally, the influence of component tolerance on the diagnosis result is analyzed, and the method to reduce the influence of tolerance is studied according to the characteristics of the proposed method.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and in particular relates to an analog circuit fault diagnosis model based on an algebraic method. Background technique [0002] 1. Status quo of analog circuit fault diagnosis technology [0003] In the process of design, manufacture and maintenance of the circuit system, it is necessary to study related fault diagnosis techniques to improve system reliability and reduce the cost of production testing and maintenance. Analog circuits have the characteristics of limited access to measurement points, infinitely many states of signal values, tolerances of device parameters, nonlinear relationship between circuit response and component characteristics, etc., resulting in the lack of fault diagnosis models and difficulty in fault diagnosis. Therefore, the study of analog circuit fault diagnosis is a topic with important theoretical research and engineering application value. P...

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Problems solved by technology

[0031] In order to overcome the problems of the existing analog circuit fault diagnosis model that fault parameter identification cannot be realized, the fault diagnosis time is too long, the application range is small, the fault diagnosis is affected by the tolerance of components, and the diagnosis result is sensitive to noise, which leads to inaccurate fault detection and fault diagnosis. Realizing under-sampling leads to the problem of increased cost when detecting high-frequency circuit faults. The invention provides an analog circuit fault diagnosis based on an algebraic method. This method unifies fault detection, fault location, and fault parameter identification into one The integrated processing on the model is convenient for implementation, and the online calculation time is less, which can effectively overcome the influence of noise on the fault diagnosis results and meet the actual needs of engineering applications. Moreover, the particularity of this method solves the problem that the parameters of analog circuit devices are continuous and difficult to carry out parameter identification. At the same time, the method can still achieve fault diagnosis under certain under-sampling conditions. Finally, the influence of component tolerance on the diagnosis result is analyzed. According to the characteristics of the proposed method, the method of reducing the influence of tolerance is studied.

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