Anti-radiation hardening module-level circuit simulation test method
A technology of anti-radiation hardening and simulation testing, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems affecting the overall level of microelectronics and backwardness, and achieve mature and perfect simulation technology and verification technology capabilities Effect
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[0050] Step 101: According to the standard module-level circuit design process, first define the function of the module to be designed, and analyze the standard circuit components required to complete the function module;
[0051] Step 102: Carry out invocation splicing of standard circuit components, design a special circuit structure or use reinforcement techniques such as MullerC unit, time-domain sampling technology, and changing transistor size to increase critical charge to complete the design of the entire module-level circuit;
[0052] Step 103: Carry out SPICE pre-simulation on the circuit, embed the single event radiation damage model into the netlist file, and then use the specified transient pulse current source to simulate the transient current generated when the high-energy particle is incident on the sensitive node, according to the circuit The response of the module after injecting current at different nodes can obtain the single event effect sensitive nodes and...
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