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System for testing GAMMA curve and testing method thereof

A curve and testing instrument technology, applied in nonlinear optics, instruments, optics, etc., can solve the problems of low efficiency and time-wasting GAMMA curve, and achieve the effects of shortening product development cycle, saving operation time, and rapid testing

Pending Publication Date: 2020-04-17
SHENZHEN K&D TECHONOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the low efficiency of the existing debugging GAMMA curve, and there are many situations requiring manual operation, which is a waste of time, and provides a method for testing the GAMMA curve

Method used

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  • System for testing GAMMA curve and testing method thereof
  • System for testing GAMMA curve and testing method thereof
  • System for testing GAMMA curve and testing method thereof

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Embodiment Construction

[0020] The content of the present invention will be further described below in conjunction with the accompanying drawings and preferred specific embodiments of the present invention. The examples given are only for explaining the present invention, not for limiting the scope of the present invention.

[0021] Such as Figure 5 to Figure 6 As shown in, a system for testing the GAMMA curve described in this scheme, the system includes a drive board, a main control device, a power supply, a test display screen and a brightness test instrument, the drive board is connected to the power supply, and the drive One end of the board is connected to the main control device, and the other end of the driving board is connected to the test display screen; the brightness test instrument is provided with a test probe, and the test probe is wirelessly connected to the test display screen, and the test probe is used to detect the test display screen, the brightness testing instrument is conne...

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Abstract

The invention relates to a system for testing a GAMMA curve and belongs to the electronic technology field. The system comprises a driving board, a main control device, a power supply, a test displayscreen and a brightness test instrument, wherein the driving board is connected with the power supply, one end of the driving board is connected with the main control device, the other end of the driving board is connected with a test display screen, the brightness test instrument is provided with a test probe, the test probe is in wireless contact with the test display screen, the test probe is used for detecting the test display screen, and the brightness test instrument is connected with the main control device. The GAMMA curve can be rapidly tested, the operation time is saved, debugging efficiency is improved, and the product development period is shortened.

Description

technical field [0001] The invention relates to a system for testing a GAMMA curve and a testing method thereof. Background technique [0002] Display is an important interface between human and machine. LCM liquid crystal display (LCD) has the advantages of clear and delicate images, no flicker, no eye damage, no radiation, low power consumption, and thinner and lighter. Widely used in various display fields. [0003] Since the human eye's perception of brightness changes is not linear (the perception of low brightness changes is more acute than that of high brightness changes), it is necessary to make artificial corrections when debugging the display to adapt to this objective characteristic of the human eye. , so that the adjusted picture is most suitable for human observation. This debugging process is called GAMMA curve debugging. The GAMMA curve is a relationship curve made by measuring the brightness corresponding to different gray scales. See attached for differe...

Claims

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Application Information

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IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 张西洋魏恒军周昆李仲儒陈春荣
Owner SHENZHEN K&D TECHONOLOGY
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