Multipath high-speed signal acquisition aging screening test bench

Abstract

The invention belongs to the technical field of aging screening test equipment, and particularly relates to a multipath high-speed signal acquisition aging screening test bench which comprises a control panel. The control panel comprises an FPGA module, a leakage current sampling module, a DIO, a relay array switching circuit and a fuse detection circuit module. The leakage current sampling modulecomprises a high-speed ADC, an analog signal conditioning circuit, an IV conversion circuit and a calibration circuit. The burn-in board is in signal connection with the IV conversion circuit, the relay array switching circuit and the fuse detection circuit module. Signals of the relay array switching circuit and the fuse detection circuit module are connected with the DIO signals. The DIO is insignal connection with the FPGA module, the IV conversion circuit is in signal connection with the analog signal conditioning circuit, the high-speed ADC and the FPGA module in sequence, the high-speed ADC is in signal connection with the calibration circuit, and the calibration circuit is in signal connection with the FPGA module.

Description

technical field [0001] The invention belongs to the technical field of aging screening test equipment, and in particular relates to a multi-channel high-speed signal acquisition aging screening test bench. Background technique [0002] Reliability analysis is a measure of the ability of an electronic component to work without failure when it is put into service. The life period of electronic components is divided into aging period, service life period and wear-out period. Among them, there are early failures in the aging period, and the failure rate is relatively high; the failure rate is relatively stable during the service life; and the failure rate is also high in the wear-out period. Reliability screening test is to eliminate defective products caused by potential bad factors in a batch of products. After eliminating the early failure screening, the failure rate of the product can be reduced by one to two orders of magnitude. At present, there are mainly two test mode...

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Problems solved by technology

The second method is to measure the data of each station through the inspection method. This method is much more advanced than the first method, but because the data measurement integration takes time during the inspection and measurement process, and the station is switched at the same time. It also takes time, and it takes about 5 minutes for all stations to inspect and measure once.

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