Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Efficient testing device for mainboard

A technology for testing devices and main boards, which is applied to measuring devices, measuring device casings, and electronic circuit testing, etc. It can solve problems such as low production efficiency and damage to CPU slot pins, achieve high accuracy, long service life, and reduce production management cost effect

Inactive Publication Date: 2020-05-08
FUJIAN CENTM INFORMATION
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a high-efficiency testing device for the motherboard, which solves the problems of low production efficiency and damaged pins of the CPU slot in the prior art when performing a performance test on the CPU

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Efficient testing device for mainboard
  • Efficient testing device for mainboard
  • Efficient testing device for mainboard

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] The embodiment of the present application provides a high-efficiency test device for the motherboard, which solves the problems of low production efficiency and damage to the pins of the CPU slot in the prior art when performing performance tests on the CPU, and realizes improving debugging production efficiency and reducing Technical effects of loss costs during production testing.

[0041] The technical solution in the embodiment of the present invention is to solve the above-mentioned problems, and the general idea is as follows: Utilize the weldability of the protective cover on the back of the CPU to weld the CPU flatly to the bottom of a copper block; at the same time, set the motherboard tray directly below the CPU, and After the motherboard to be tested is placed on the motherboard tray, the CPU slot on the motherboard to be tested is precisely aligned with the CPU; when the test is required, the CPU is moved downward through the linkage of the lifting device, so...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an efficient testing device for a mainboard. The efficient testing device comprises a supporting base, a mainboard tray, a lifting device, a CPU fixing mechanism and external test equipment, wherein the mainboard tray is fixedly arranged on the supporting base; the bottom part of the lifting device is fixedly arranged on the supporting base, and the lifting device is locatedabove the mainboard tray; the CPU fixing mechanism is fixedly connected with the movable end of the lifting device; the external test equipment is arranged on the supporting base; during testing, a to-be-tested mainboard is placed on the mainboard tray, and the external test equipment is connected with the to-be-tested mainboard; a CPU on the CPU fixing mechanism is linked with a CPU groove in the to-be-tested mainboard by means of the lifting device for contact testing; and after the testing is finished, the CPU on the CPU fixing mechanism is linked to leave the CPU groove in the to-be-tested mainboard by means of the lifting device. The efficient testing device has the advantages that the debugging production efficiency is improved, and the loss cost of the high-value CPU processor chipin the production test process is reduced.

Description

technical field [0001] The invention relates to the field of mainboard testing, in particular to a high-efficiency testing device for a mainboard. Background technique [0002] At present, the update iteration of Intel Core CPU processor is very rapid. On the one hand, in customer applications for different scenarios, the configuration requirements of CPU processors vary widely; on the other hand, because the pins of the LGA package socket are too fragile, maintenance is difficult; the above two problems have always plagued the production plan of PC terminal manufacturers. If the motherboard is produced directly with the CPU, it is inevitable that a large number of rectification and replacement of the CPU will be required due to the different configuration requirements of customers, which not only wastes production capacity, but also greatly increases the risk of damage to the socket pins; if only bare boards without CPU are produced , the CPU needs to be picked and placed ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04B25B11/00H01L21/66H01L23/367
CPCB25B11/00G01R1/04G01R31/2806G01R31/2808G01R31/2825H01L22/14H01L23/3672
Inventor 郑荣林日辉曾建伟
Owner FUJIAN CENTM INFORMATION
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products