Integrated single-chip microcomputer chip anomaly analysis system

Abstract

The invention relates to the technical field of single-chip microcomputer chip anomaly analysis, in particular to an integrated single-chip microcomputer chip anomaly analysis system, which comprisesa computer and an anomaly analysis terminal, and is characterized in that the anomaly analysis terminal comprises a power supply unit, a control unit, an AD detection unit, a storage unit and a display unit; the computer is used for inputting test commands; the power supply unit supplies power to the anomaly analysis terminal; the control unit is used as a processor of the anomaly analysis terminal to receive a test instruction from the computer and execute a corresponding test function on a to-be-tested single-chip microcomputer chip according to the test instruction to obtain a test result;the AD detection unit is used for testing power consumption under 3V / 5V; the storage unit is used for storing correct programming program codes of a single-chip microcomputer and providing programmingprogram codes to the control unit for program area check code testing; and the display unit is used for receiving the test result from the control unit and displaying the test result. According to the scheme, automatic and integrated testing of the single-chip microcomputer chip can be realized, the testing efficiency and accuracy are high, and the testing cost is low.

Description

technical field [0001] The invention relates to the technical field of single-chip microcomputer chip abnormality analysis, in particular to an integrated single-chip microcomputer chip abnormality analysis system. Background technique [0002] Single-chip microcomputer (Single-Chip Microcomputer) is an integrated circuit chip, which uses VLSI technology to integrate a central processing unit CPU with data processing capabilities, random access memory RAM, read-only memory ROM, various I / O ports and interrupt systems. , timer / counter and other functions (may also include display drive circuit, pulse width modulation circuit, analog multiplexer, A / D converter and other circuits) integrated into a small but complete microcomputer system formed on a silicon chip , Widely used in the field of industrial control. From the 4-bit and 8-bit single-chip microcomputer at that time to the current 300M high-speed single-chip microcomputer in the 1980s, the single-chip microcomputer has...

AI Technical Summary

Problems solved by technology

Under normal circumstances, based on the complexity of each component in the circuit unit, the abnormality analysis of the chip-level device is performed first. The chip itself is functionally tested to determine whether there is an abnormality. This manual testing method is not only low in testing efficiency, but also easily misses testing problem points during manual testing, resulting in incomplete testing. Manual testing requires testers to have relatively high professional knowledge, which further increases labor costs and leads to high chip testing costs

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