Three-node overturning resistant D latch for high-frequency circuit application

Abstract

The invention discloses a three-node overturning resistant D latch for high-frequency circuit application, and belongs to the field of anti-nuclear reinforcement in integrated circuit reliability. Theproblems that a traditional D latch resisting three-node overturning needs to consume more hardware, and is high in power consumption, long in transmission path and large in transmission delay are solved. The D latch comprises 34 NMOS transistors N1 to N34 and 16 PMOS transistors P1 to P16, according to the invention, the NMOS transistors are connected in series and stacked for construction, thestacking mode can effectively reduce the problem of electric leakage caused by threshold loss, and protection of quick recovery of three-node overturning is realized. And some nodes are connected by adopting a principle of nearby connection, so that connected metal wires are shorter and symmetrical, the layout area is small, and the communication performance is better and the recovery time is shorter. The invention is mainly applicable to high-frequency circuits.

Description

technical field [0001] The invention belongs to the field of anti-nuclear reinforcement in integrated circuit reliability. Background technique [0002] As the feature size of the device decreases, the junction capacitance of the device decreases, the operating voltage decreases, and the single-event critical charge decreases. more sensitive. [0003] Due to the changes in the material, structure and size of nanodevices, the coupling relationship between the single-event effect and circuit logic is also more complex, and phenomena such as obvious single-event crosstalk and multi-node charge collection appear. For multi-node charge collection caused by a single particle, the node directly hit by the particle is usually called the active node, the node indirectly affected by the charge diffusion generated by the single particle is called the passive node, and the active node charge affects the passive node through charge diffusion. The process of nodes is called charge shari...

AI Technical Summary

Problems solved by technology

[0004] The present invention aims to solve the problems that the traditional anti-three-node flipping D latch requires more hardware, high power consumption, long transmission path, and large transmission delay. Three-node Flip D-Latch

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