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An improved integrated circuit TEM cell radiation emission measurement device and method

An integrated circuit and measurement system technology, applied in the field of integrated circuit TEM cell measurement system, can solve the problems that the study of a single electric field or a single magnetic field cannot be realized, and achieve the effects of simple and practical structure, convenient operation, and improved perception

Active Publication Date: 2022-07-19
TIANJIN INST OF ADVANCED TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, the TEM cell measures the mixed field of transverse electric waves, and cannot realize the study of a single electric field or a single magnetic field. This is a shortcoming of the current TEM cell test.

Method used

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  • An improved integrated circuit TEM cell radiation emission measurement device and method
  • An improved integrated circuit TEM cell radiation emission measurement device and method
  • An improved integrated circuit TEM cell radiation emission measurement device and method

Examples

Experimental program
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Embodiment 1

[0033] This embodiment discloses an integrated circuit TEM cell measurement system.

[0034] like figure 1 As shown, the system of this embodiment includes:

[0035] The TEM cell 100 is used to receive the electromagnetic field emitted by the chip under test.

[0036] The electromagnetic interference test receiver 200 is connected to the TEM cell through a radio frequency line, such as the TEM cell output end 101 in the figure; the electromagnetic interference test receiver is used to collect the electromagnetic field signal emitted by the TEM cell.

[0037] Power supply, used to supply power to the chip under test.

[0038] The computer 300 and corresponding control software are used to control and monitor the test receiver and corresponding test components.

[0039] In this embodiment, the TEM cell includes a torch-shaped field probe, refer to Figure 7 , 9 , 11 and 13, the TEM cell test window 102 is circular and is equipped with a circular isolation ring with a scale;...

Embodiment 2

[0047] This embodiment discloses a method for measuring an integrated circuit TEM cell, including:

[0048] Step S1, deploying the integrated circuit TEM cell measurement system as in the above embodiment.

[0049] Step S2, in the test process, switch at least three different relative angles between the reference mark on the flashlight-shaped field probe and the dial on the circular isolation ring according to any step length less than 90 degrees, and test the corresponding relative angles of each relative angle respectively. The noise and radiation data in the power-on state of the chip are measured, combined with the measurement data at different relative angles for data analysis.

[0050] Preferably, the method of this embodiment further includes: during the testing process, the lowest emission level of the tested chip is at least 6dB higher than the noise level; so as to avoid adverse effects of environmental noise on the test results.

[0051] For example, a specific tes...

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Abstract

The invention relates to the technical field of integrated circuit testing, and discloses an integrated circuit TEM cell measurement system and method, so as to obtain the multi-dimensional data of the test to ensure the accuracy of the test. The system of the invention includes: a TEM cell, which is used for receiving the electromagnetic field emitted by the tested chip; an electromagnetic interference test receiver, which is connected to the TEM cell through a radio frequency line, and is used for collecting the electromagnetic field signal emitted by the TEM cell; a power supply, which is used for Supply power to the chip under test; a computer and corresponding control software are used to control and monitor the test receiver and corresponding test components; wherein, the TEM cell includes a torch-shaped field probe, and the TEM cell test window is circular and equipped with A circular isolation ring with a scale; the outer wall of the TEM cell is provided with a reference mark corresponding to the scale on the circular isolation ring; there is a generator between the flashlight-shaped field probe and the circular isolation ring. Slip structure for angular rotation.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, and in particular, to an integrated circuit TEM (Transverse Electromagnetic Wave, Transverse Electromagnetic Wave) cell measurement system and method. Background technique [0002] Domestic electromagnetic compatibility research mainly focuses on system-level equipment and products, while the electromagnetic compatibility of integrated circuits started late. Although it is gradually in line with the world's cutting-edge research directions, there is still a big gap. Foreign high-performance and high-reliability IC products are often used in cutting-edge fields, and the EMC of systems and integrated circuits is mainly controlled by foreign companies. There is no national-level EMC test and verification standard for integrated circuits in my country, and only chip-level EMC issues are considered in individual applications. With the development of my country's domestic chip, aero...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/00
CPCG01R31/2862G01R31/002
Inventor 吴建飞郑亦菲李雅菲张红丽李宏吴健煜王宏义郑黎明刘培国
Owner TIANJIN INST OF ADVANCED TECH