Preparation method of ionic probe liquid sample target
A liquid sample and ion probe technology, applied in the field of ion probes, can solve problems such as inability to test isotopes, and achieve the effects of easy operation, less pollution, and wider application fields
Inactive Publication Date: 2020-05-22
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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Problems solved by technology
H-O (and other SIMS-detectable isotopes in other liquids) isotope measurements of water (and other liquid substances) using ion probes (SIMS), however, are not available due to lack of liquid sample target preparation methods
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[0037] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
[0038] The basic principle of the ion probe (SIMS) test sample is to bombard the surface of the sample with high-energy negative oxygen ions (also using other ions, such as Cs+), and measure the isotopic composition of the atoms (ie ions) that are activated by the splash and ionized, so as to Perform age and stable isotope determinations of solid geological minerals. It has the following advantages: it does not require chemical treatment, has high resolution, and can perform micro-area (about 20 micron) analysis on the sample without substantially destroying the sample. At present, the preparation methods of solid single mineral particles in the world are basically the same. The sample particles and standard substance par...
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Abstract
The invention discloses a preparation method of an ionic probe liquid sample target. The preparation method comprises the following steps of: arranging a sample pool on a first chip; arranging a window on a second chip, wherein the position of the window corresponds to the position of the sample pool; adding a to-be-detected liquid sample and standard substance water into the sample pool; smearinga liquid sealant on the first chip; placing the second chip on the first chip, and performing pressing to enable the second chip to be adhered to the first chip through the liquid sealant; and solidifying the colloid pasting the first chip and the second chip to obtain the ionic probe liquid sample target. The preparation method of the ionic probe liquid sample target is easy to operate and can be popularized and used in a large range. Also a sample is not easily polluted in the preparation process. The successful use of the technology can break through the ionic probe liquid sample test blank, and broaden the application field of the ionic liquid trace element and stable isotope analysis and test technology.
Description
technical field [0001] The invention relates to the technical field of ion probes, in particular to a method for preparing an ion probe liquid sample target. Background technique [0002] The ion probe (abbreviated as SIMS) has the advantages of high mass resolution, high sensitivity and high analysis precision, its analysis beam spot is small (generally less than 20 microns), and the sample consumption is low (10 -9 grams), has an irreplaceable technical advantage in the field of micro-area in-situ analysis, and is widely used in the fields of earth science, astrogeology and environmental geology. [0003] Ion probe analysis technology mainly includes two important links: sample preparation and instrument testing and analysis. At present, ion probe (SIMS) laboratories at home and abroad have very mature methods for solid sample preparation and testing. In order to ensure that the sample target (1-inch cylindrical) is not damaged during the test of the SIMS instrument, the ...
Claims
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Login to View More IPC IPC(8): G01N1/28
CPCG01N1/28
Inventor 李娇刘宇李秋立
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI