Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Quantum interferometer device based on optical parameter amplifier

An optical parameter and quantum interference technology, which is applied in the field of quantum precision measurement, can solve the problems of small number of photons, low absolute accuracy of phase measurement, and limit the practical application of interferometer, and achieve the effect of improving sensitivity and high precision phase measurement

Active Publication Date: 2020-05-29
SHANXI UNIV
View PDF17 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The above research work has realized the quantum interferometer based on the photon system, and solved the problem that the optical interferometer breaks through the standard quantum limit. practical application in

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Quantum interferometer device based on optical parameter amplifier
  • Quantum interferometer device based on optical parameter amplifier
  • Quantum interferometer device based on optical parameter amplifier

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below. Obviously, the described embodiments are part of the embodiments of the present invention, rather than All the embodiments; based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative work all belong to the protection scope of the present invention.

[0026] Such as figure 1 As shown, the embodiment of the present invention provides a quantum interferometer device based on an optical parametric amplifier, including a light source unit 1, an optical chopper 21, a first optical beam splitter 22, a second optical beam splitter 24, a first An optical parametric amplifier 3, a second optical parametric amplifier 4, a phase sensor 23 and a measurement system 5; the li...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of quantum precision measurement and discloses a quantum interferometer device based on an optical parameter amplifier. The device comprises a light sourceunit, an optical chopper, a first optical beam splitter, a second optical beam splitter, a first optical parameter amplifier, a second optical parameter amplifier, a phase sensor and a measurement system. The device is advantaged in that phase-sensitive field intensity amplification and noise compression of an interferometer are achieved through the two optical parameter amplifiers, high-sensitivity phase measurement can be achieved. The device has advantages of being compact in structure, convenient to adjust, good in reliability and the like, and has important application value in quantum precision measurement.

Description

technical field [0001] The invention relates to a quantum interferometer device based on an optical parameter amplifier, which belongs to the technical field of quantum precision measurement. Background technique [0002] In the development of quantum information science, quantum precision measurement is one of the current research hotspots. By utilizing quantum resources, quantum precision measurement can significantly improve the sensitivity of sensing and the resolution of imaging. The interferometer is one of the important measurement tools, and its phase change is very sensitive to many physical quantities that can affect the optical path, such as biological tissue, gravitational waves, displacement and mechanical quantities. However, the ultimate sensitivity of the interferometer is limited by the standard quantum limit determined by the vacuum fluctuations of the electromagnetic field. Therefore, the realization of an interferometer that breaks through the standard ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B9/02G02F1/39
CPCG01B9/0201G01B9/0207G02F1/39
Inventor 闫智辉左小杰贾晓军彭堃墀
Owner SHANXI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com