Super-resolution total internal reflection microscopic imaging device and method based on polarity scattering

A technology of total internal reflection and microscopic imaging, which is applied in the methods of obtaining spatial resolution, microscopes, measuring devices, etc., can solve the problems of narrow field of view, slow development, short imaging time, etc., and achieve the effect of improving resolution

Active Publication Date: 2020-06-05
HARBIN INST OF TECH +2
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Problems solved by technology

However, this method needs to overcome the fundamental physical bottleneck of the diffraction limit in optics, so the development is very slow, and the existing non-fluorescent label super-resolution microscopy technology has poor real-time performance and narrow field of view, and cannot solve the problem of fluorescence super-resolution microscopy well. Problems such as poor universality of microtechnology and short imaging time

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  • Super-resolution total internal reflection microscopic imaging device and method based on polarity scattering
  • Super-resolution total internal reflection microscopic imaging device and method based on polarity scattering
  • Super-resolution total internal reflection microscopic imaging device and method based on polarity scattering

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Embodiment Construction

[0039] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0040] On the one hand, see attached figure 1 , the embodiment of the present invention discloses a super-resolution total internal reflection microscopic imaging device based on polar scattering, the device includes a polarization illumination module, a beam scanning module and an analysis and detection module, The detection modules are arranged sequentially along the direction of light propagation;

[0041] The polarized lighting module is sequentially prov...

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Abstract

The invention discloses a super-resolution total internal reflection microscopic imaging device and method based on polarity scattering, and the device comprises a polarization illumination module, alight beam scanning module, and a polarization detection module, and the polarization illumination module, the light beam scanning module, and the polarization detection module are sequentially arranged in a light propagation direction. The polarization illumination module is sequentially provided with a laser, a first polaroid and a quarter-wave plate in the light propagation direction. The lightbeam scanning module is sequentially provided with a two-dimensional scanning galvanometer, a scanning lens, a first tube mirror, a conical reflector and a conical lens in the light propagation direction. The polarization detection module is sequentially provided with an objective lens, a second polaroid, a second tube mirror and a camera in the light propagation direction. According to the device and the method, super-resolution imaging can be realized without fluorescent dyeing, the dynamic bleaching characteristic of a sample without similar fluorescent imaging can be observed more truly,long-time imaging can be realized, super-resolution can be realized without marking, and m-time resolution improvement can be obtained according to different orders m.

Description

technical field [0001] The invention relates to the technical field of microscopic imaging, and more specifically relates to a super-resolution total internal reflection microscopic imaging device and method based on polar scattering. Background technique [0002] At present, in conventional super-resolution microscopy, fluorescent markers are usually required. Traditional fluorescence super-resolution microscopy techniques use the nonlinear effect of fluorescent particles to distinguish structures that are very close to achieve super-resolution effects. The super-resolution imaging method based on fluorescently labeled samples has strict requirements on both fluorescent particles and imaging samples, and is not universally applicable. Labeled samples cannot be imaged for a long time due to their photobleaching characteristics, and it is easy to cause rejection of organisms, affecting A theoretical study of the effects of motion on biological properties. [0003] In contras...

Claims

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Application Information

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IPC IPC(8): G02B21/00G02B21/06G02B21/36G01N21/552G01N21/01
CPCG02B21/0048G02B21/0032G02B21/0072G02B21/0068G02B21/06G02B21/367G01N21/552G01N21/01G01N2021/0112G01N2021/178
Inventor 刘辰光刘俭姜勇赵唯淞陈刚
Owner HARBIN INST OF TECH
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